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The ornamental design of a housing for test and measurement instruments, as shown and described.
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FIG. 1 is a perspective view of a housing for test and measurement instruments;
FIG. 2 is a front elevation view of the housing for test and measurement instruments;
FIG. 3 is a left side elevation view of the housing for test and measurement instruments;
FIG. 4 is a right side elevation view of the housing for test and measurement instruments;
FIG. 5 is a top plan view of the housing for test and measurement instruments;
FIG. 6 is a bottom plan view of the housing for test and measurement instruments; and,
FIG. 7 is a rear elevation view of the housing for test and measurement instruments.
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| Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
| Apr 30 2004 | Tektronix, Inc. | (assignment on the face of the patent) | / | |||
| Apr 30 2004 | WRISLEY, JERRY W | Tektronix, Inc | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 015696 | /0611 |
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