Patent
   D472171
Priority
Dec 20 2001
Filed
Dec 20 2001
Issued
Mar 25 2003
Expiry
Mar 25 2017
Assg.orig
Entity
unknown
16
5
n/a
The ornamental design of a measurement instrument housing, as shown and described.

The ornamental design disclosed in this application is for a measurement instrument housing having a rectangular protrusion extending from a portion of a curved rear surface.

FIG. 1 is a perspective view of a measurement instrument housing;

FIG. 2 is a front elevation view of the measurement instrument housing;

FIG. 3 is a top plan view of the measurement instrument housing;

FIG. 4 is a bottom plan view of the measurement instrument housing;

FIG. 5 is a left side elevation view of the measurement instrument housing;

FIG. 6 is a right side elevation view of the measurement instrument housing; and,

FIG. 7 is a rear elevation view of the measurement instrument housing.

Wrisley, Jerry L., Ayers, Kevin C., Mc Grath, Jr., James H.

Patent Priority Assignee Title
D499658, Apr 30 2004 Tektronix, Inc.; Tektronix, Inc Waveform generator
D500694, Apr 30 2004 Tektronix, Inc.; Tektronix, Inc Housing for test and measurement instruments
D500695, Apr 30 2004 Tektronix, Inc.; Tektronix, Inc Housing for test and measurement instruments
D500957, Apr 30 2004 Tektronix, Inc.; Tektronix, Inc Housing for test and measurement instruments
D504079, Apr 30 2004 Tektronix, Inc.; Tektronix, Inc Oscilloscope instrument
D504080, Apr 30 2004 Tektronix, Inc.; Tektronix, Inc Oscilloscope instrument
D508426, Apr 30 2004 Tektronix, Inc.; Tektronix, Inc Housing for test and measurement instruments
D514004, Apr 30 2004 Tektronix, Inc.; Tektronix, Inc Waveform generator
D553520, Nov 16 2005 TELEDYNE LECROY, INC Housing for test and measurement instrument
D578911, Feb 04 2008 TELEDYNE LECROY, INC Housing for test and measurement instrument
D581821, Feb 04 2008 TELEDYNE LECROY, INC Housing for test and measurement instrument
D599832, Feb 25 2008 FORMA DESIGN, LLC; ADVANCED LIQUID LOGIC, INC Benchtop instrument housing
D820127, Nov 21 2014 Tektronix, Inc. Housing for a test and measurement instrument
D820129, Nov 21 2014 Tektronix, Inc. Front panel for a measurement instrument
D821234, Jul 11 2016 Tektronix, Inc Multi-channel measurement instrument housing
D947693, Sep 20 2019 Tektronix, Inc Measurement probe head assembly
Patent Priority Assignee Title
4972138, May 11 1987 Agilent Technologies Inc Oscilloscope-like user-interface for a logic analyzer
4977514, May 08 1987 Agilent Technologies Inc Overlaid digital waveforms display
5003248, Nov 10 1986 Agilent Technologies Inc Probability density histogram display
5247287, Sep 24 1990 Snap-On Incorporated Digital engine analyzer
D413823, Jul 28 1998 Tektronix, Inc.; Tektronix, Inc Electronic test and measurement instrument
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Dec 19 2001WRISLEY, JERRY L TEKTRONIX INC ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0136270644 pdf
Dec 19 2001MCGRATH, JAMES H , JR TEKTRONIX INC ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0136270644 pdf
Dec 19 2001AYERS, KEVIN C TEKTRONIX INC ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0136270644 pdf
Dec 20 2001Tektronix, Inc.(assignment on the face of the patent)
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