|
The ornamental design of a housing for test and measurement instruments, as shown and described.
|
The ornamental design disclosed in this application is for a housing for test and measurement instruments, such as oscilloscopes, logic analyzers, waveform generators, and the like. The housing has a substantially rectangular front face with a substantially rectangular opening disposed in a portion thereof, side surfaces having a curved top edges, and a top surface having curved surfaces adjacent to the curved top edges of the side surfaces that transition to a substantially flat surface extending from the front face to the rear surface, and protrusions extending over the corners of the rectangular front face and extending partially along top, bottom and sides surfaces of the housing. Each protrusion has at least a first channel formed on the top surface, the bottom surface and the side surfaces. A recessed handle is flush with the top surface and a portion of the rear surface.
FIG. 1 is a perspective view of a housing for test and measurement instruments;
FIG. 2 is a front elevation view of the housing for test and measurement instruments;
FIG. 3 is a left side elevation view of the housing for test and measurement instruments;
FIG. 4 is a right side elevation view of the housing for test and measurement instruments;
FIG. 5 is a top plan view of the housing for test and measurement instruments;
FIG. 6 is a bottom plan view of the housing for test and measurement instruments; and,
FIG. 7 is a rear elevation view of the housing for test and measurement instruments.
Wrisley, Jerry L., McGrath, James H., Kreitzer, Robert R., Martin, Jim L.
Patent | Priority | Assignee | Title |
D553520, | Nov 16 2005 | TELEDYNE LECROY, INC | Housing for test and measurement instrument |
D659128, | Mar 25 2011 | WORLD PRODUCTS, INC | Antenna housing |
D820127, | Nov 21 2014 | Tektronix, Inc. | Housing for a test and measurement instrument |
D820129, | Nov 21 2014 | Tektronix, Inc. | Front panel for a measurement instrument |
Patent | Priority | Assignee | Title |
6437552, | Jul 31 2000 | TELEDYNE LECROY, INC | Automatic probe identification system |
D413823, | Jul 28 1998 | Tektronix, Inc.; Tektronix, Inc | Electronic test and measurement instrument |
D420607, | Apr 09 1999 | Tektronix, Inc. | Front panel for a measurement instrument |
D460371, | Dec 20 2001 | Tektronix, Inc. | Measurement instrument |
D460703, | Dec 20 2001 | Tektronix, Inc. | Measurement instrument |
D472171, | Dec 20 2001 | Tektronix, Inc. | Measurement instrument housing |
Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
Apr 30 2004 | Tektronix, Inc. | (assignment on the face of the patent) | / | |||
Apr 30 2004 | WRISLEY, JERRY L | Tektronix, Inc | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 015940 | /0941 | |
Apr 30 2004 | MC GRATH, JAMES H | Tektronix, Inc | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 015940 | /0941 | |
Apr 30 2004 | KREITZER, ROBERT R | Tektronix, Inc | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 015940 | /0941 | |
Apr 30 2004 | MARTIN, JIM L | Tektronix, Inc | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 015940 | /0941 |
Date | Maintenance Fee Events |
Date | Maintenance Schedule |