Patent
   D500694
Priority
Apr 30 2004
Filed
Apr 30 2004
Issued
Jan 11 2005
Expiry
Jan 11 2019
Assg.orig
Entity
unknown
4
6
n/a
The ornamental design of a housing for test and measurement instruments, as shown and described.

The ornamental design disclosed in this application is for a housing for test and measurement instruments, such as oscilloscopes, logic analyzers, waveform generators, and the like. The housing has a substantially rectangular front face with a substantially rectangular opening disposed in a portion thereof, side surfaces having a curved top edges, and a top surface having curved surfaces adjacent to the curved top edges of the side surfaces that transition to a substantially flat surface extending from the front face to the rear surface, and protrusions extending over the corners of the rectangular front face and extending partially along top, bottom and sides surfaces of the housing. Each protrusion has at least a first channel formed on the top surface, the bottom surface and the side surfaces. A recessed handle is flush with the top surface and a portion of the rear surface.

FIG. 1 is a perspective view of a housing for test and measurement instruments;

FIG. 2 is a front elevation view of the housing for test and measurement instruments;

FIG. 3 is a left side elevation view of the housing for test and measurement instruments;

FIG. 4 is a right side elevation view of the housing for test and measurement instruments;

FIG. 5 is a top plan view of the housing for test and measurement instruments;

FIG. 6 is a bottom plan view of the housing for test and measurement instruments; and,

FIG. 7 is a rear elevation view of the housing for test and measurement instruments.

Wrisley, Jerry L., McGrath, James H., Kreitzer, Robert R., Martin, Jim L.

Patent Priority Assignee Title
D553520, Nov 16 2005 TELEDYNE LECROY, INC Housing for test and measurement instrument
D659128, Mar 25 2011 WORLD PRODUCTS, INC Antenna housing
D820127, Nov 21 2014 Tektronix, Inc. Housing for a test and measurement instrument
D820129, Nov 21 2014 Tektronix, Inc. Front panel for a measurement instrument
Patent Priority Assignee Title
6437552, Jul 31 2000 TELEDYNE LECROY, INC Automatic probe identification system
D413823, Jul 28 1998 Tektronix, Inc.; Tektronix, Inc Electronic test and measurement instrument
D420607, Apr 09 1999 Tektronix, Inc. Front panel for a measurement instrument
D460371, Dec 20 2001 Tektronix, Inc. Measurement instrument
D460703, Dec 20 2001 Tektronix, Inc. Measurement instrument
D472171, Dec 20 2001 Tektronix, Inc. Measurement instrument housing
/////
Executed onAssignorAssigneeConveyanceFrameReelDoc
Apr 30 2004Tektronix, Inc.(assignment on the face of the patent)
Apr 30 2004WRISLEY, JERRY L Tektronix, IncASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0159400941 pdf
Apr 30 2004MC GRATH, JAMES H Tektronix, IncASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0159400941 pdf
Apr 30 2004KREITZER, ROBERT R Tektronix, IncASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0159400941 pdf
Apr 30 2004MARTIN, JIM L Tektronix, IncASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0159400941 pdf
n/a
Date Maintenance Fee Events


n/a
Date Maintenance Schedule