Patent
   D413823
Priority
Jul 28 1998
Filed
Jul 28 1998
Issued
Sep 14 1999
Expiry
Sep 14 2013
Assg.orig
Entity
unknown
18
3
n/a
The ornamental design for an electronic test and measurement instrument, as shown and described.

FIG. 1 is a perspective view of the electronic test and measurement instrument showing our new design;

FIG. 2 is a front elevation view of the instrument showing in dotted lines an example of front panel knobs and buttons which may be used with the subject design;

FIG. 3 is a right side elevation view of the instrument;

FIG. 4 is a left side elevation view of the instrument;

FIG. 5 is a top end elevation view of the instrument;

FIG. 6 is a bottom end elevation view of the instrument;

FIG. 7 is a back elevation view of the instrument; and,

FIG. 8 is a front elevation view of the instrument.

Dobyns, Kenneth P., Pooley, William R., Ketterer, Scott

Patent Priority Assignee Title
7654281, Jan 22 2004 ROCHESTER SENSORS, LLC Gauge assembly having a stop fill device
D423383, Jun 30 1999 Keysight Technologies, Inc Instrument front panel
D460371, Dec 20 2001 Tektronix, Inc. Measurement instrument
D460703, Dec 20 2001 Tektronix, Inc. Measurement instrument
D472171, Dec 20 2001 Tektronix, Inc. Measurement instrument housing
D499658, Apr 30 2004 Tektronix, Inc.; Tektronix, Inc Waveform generator
D500694, Apr 30 2004 Tektronix, Inc.; Tektronix, Inc Housing for test and measurement instruments
D500695, Apr 30 2004 Tektronix, Inc.; Tektronix, Inc Housing for test and measurement instruments
D500957, Apr 30 2004 Tektronix, Inc.; Tektronix, Inc Housing for test and measurement instruments
D504079, Apr 30 2004 Tektronix, Inc.; Tektronix, Inc Oscilloscope instrument
D504080, Apr 30 2004 Tektronix, Inc.; Tektronix, Inc Oscilloscope instrument
D508426, Apr 30 2004 Tektronix, Inc.; Tektronix, Inc Housing for test and measurement instruments
D514004, Apr 30 2004 Tektronix, Inc.; Tektronix, Inc Waveform generator
D553520, Nov 16 2005 TELEDYNE LECROY, INC Housing for test and measurement instrument
D578911, Feb 04 2008 TELEDYNE LECROY, INC Housing for test and measurement instrument
D581821, Feb 04 2008 TELEDYNE LECROY, INC Housing for test and measurement instrument
D583693, Mar 30 2006 ROCHESTER SENSORS, LLC Dial assembly for a gauge
D947693, Sep 20 2019 Tektronix, Inc Measurement probe head assembly
Patent Priority Assignee Title
4972138, May 11 1987 Agilent Technologies Inc Oscilloscope-like user-interface for a logic analyzer
D335093, Sep 23 1991 SNAP-ON TOOLS WORLDWIDE, INC ; SNAP-ON TECHNOLOGIES, INC Digital oscilloscope
D377319, Jun 14 1995 Advantest Corporation Network analyzer
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Jul 28 1998Tektronix, Inc.(assignment on the face of the patent)
Jul 28 1998DOBYNS, KENNETH P Tektronix, IncASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0100260001 pdf
Jul 28 1998POOLEY, WILLIAM R Tektronix, IncASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0100260001 pdf
Jul 28 1998KETTERER, SCOTTTektronix, IncASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0100260001 pdf
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