Patent
   D499658
Priority
Apr 30 2004
Filed
Apr 30 2004
Issued
Dec 14 2004
Expiry
Dec 14 2018
Assg.orig
Entity
unknown
4
6
n/a
The ornamental design of a waveform generator, as shown and described.

FIG. 1 is a perspective view of a waveform generator;

FIG. 2 is a front elevation view of the waveform generator;

FIG. 3 is a left side elevation view of the waveform generator;

FIG. 4 is a right side elevation view of the waveform generator;

FIG. 5 is a top plan view of the waveform generator;

FIG. 6 is a bottom plan view of the waveform generator; and,

FIG. 7 is a rear elevation view of the waveform generator.

Wrisley, Jerry L.

Patent Priority Assignee Title
D514004, Apr 30 2004 Tektronix, Inc.; Tektronix, Inc Waveform generator
D987459, Apr 26 2021 Yokogawa Electric Corporation; Yokogawa Test & Measurement Corporation Spectrum analyzer
ER413,
ER4623,
Patent Priority Assignee Title
6437552, Jul 31 2000 TELEDYNE LECROY, INC Automatic probe identification system
D413823, Jul 28 1998 Tektronix, Inc.; Tektronix, Inc Electronic test and measurement instrument
D420607, Apr 09 1999 Tektronix, Inc. Front panel for a measurement instrument
D460371, Dec 20 2001 Tektronix, Inc. Measurement instrument
D460703, Dec 20 2001 Tektronix, Inc. Measurement instrument
D472171, Dec 20 2001 Tektronix, Inc. Measurement instrument housing
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Apr 30 2004Tektronix, Inc.(assignment on the face of the patent)
Apr 30 2004WRISLEY, JERRY L Tektronix, IncASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0159330764 pdf
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