| Patent |
Priority |
Assignee |
Title |
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Aug 10 1978 |
Hewlett-Packard Company |
Spectrum analyzer having enterable offsets and automatic display zoom |
| 4253152, |
Aug 10 1978 |
Hewlett-Packard Company |
Spectrum analyzer with parameter updating from a display marker |
| 4257104, |
Aug 10 1978 |
Hewlett-Packard Company |
Apparatus for spectrum analysis of an electrical signal |
| 4264958, |
Aug 10 1978 |
Hewlett-Packard Company |
Video processor for a spectrum analyzer |
| 4350953, |
Mar 20 1978 |
Hewlett-Packard Company |
Time interval measurement apparatus |
| 4578640, |
Sep 14 1982 |
Analogic Corporation; ANALOGIC CORPORATION, A CORP OF MA |
Oscilloscope control |
| 4695833, |
Mar 28 1983 |
Hitachi Construction Machinery Co.; Hitachi Engineering Co., Ltd. |
Man-machine interface type portable ultrasonic composite measuring apparatus |
| 4972138, |
May 11 1987 |
Agilent Technologies Inc |
Oscilloscope-like user-interface for a logic analyzer |
| 5177560, |
Nov 06 1991 |
Agilent Technologies Inc |
Optical spectrum analyzer having adjustable sensitivity |
| 5321420, |
Apr 26 1991 |
Voice Signals LLC |
Operator interface for an electronic measurement system |
| 5396444, |
Jan 09 1984 |
Agilent Technologies Inc |
Terminator keys having reciprocal exponents in a data processing system |
| 6195617, |
Mar 09 1998 |
TELEDYNE LECROY, INC |
Digital storage oscilloscope with simultaneous primary measurement and derived parameter display on common time axis and method therefor |
| 6437552, |
Jul 31 2000 |
TELEDYNE LECROY, INC |
Automatic probe identification system |
| 6774890, |
Jan 09 2001 |
Tektronix, Inc. |
Touch controlled zoom and pan of graphic displays |
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Nov 28 2005 |
METAGEEK, INC |
System and apparatus for detecting and analyzing a frequency spectrum |
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| 20040095381, |
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Mar 14 1977 |
Wiltron Company |
Electronic test instrument |
| D282351, |
Oct 11 1983 |
NORLAND CORPORATION, FORT ATKINSON,, A CORP |
Digital oscilloscope |
| D335093, |
Sep 23 1991 |
SNAP-ON TOOLS WORLDWIDE, INC ; SNAP-ON TECHNOLOGIES, INC |
Digital oscilloscope |
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Nov 06 1993 |
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Coating thickness gauge |
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Jun 14 1995 |
Advantest Corporation |
Network analyzer |
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Dec 20 2001 |
Tektronix, Inc. |
Measurement instrument |
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Dec 20 2001 |
Tektronix, Inc. |
Measurement instrument |
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Apr 30 2004 |
Tektronix, Inc.; Tektronix, Inc |
Waveform generator |
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Oct 09 2003 |
TELEDYNE LECROY, INC |
Measurement instrument |
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Oct 09 2003 |
TELEDYNE LECROY, INC |
Measurement instrument |
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Apr 30 2004 |
Tektronix, Inc.; Tektronix, Inc |
Oscilloscope instrument |
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Apr 30 2004 |
Tektronix, Inc.; Tektronix, Inc |
Oscilloscope instrument |
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Oct 09 2003 |
TELEDYNE LECROY, INC |
Measurement instrument |
| D514004, |
Apr 30 2004 |
Tektronix, Inc.; Tektronix, Inc |
Waveform generator |
| D556066, |
Jan 10 2006 |
TELEDYNE LECROY, INC |
Housing for oscilloscope |
| D663636, |
Apr 22 2011 |
Tektronix, Inc |
Front panel for a measurement instrument |
| D820127, |
Nov 21 2014 |
Tektronix, Inc. |
Housing for a test and measurement instrument |
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Nov 21 2014 |
Tektronix, Inc. |
Front panel for a measurement instrument |
| D845797, |
Dec 01 2016 |
Elma Electronic AG |
Versatile casing for electronic equipment |
| D955246, |
May 31 2018 |
Micromass UK Limited |
Mass spectrometer |