Patent
   D504080
Priority
Apr 30 2004
Filed
Apr 30 2004
Issued
Apr 19 2005
Expiry
Apr 19 2019
Assg.orig
Entity
unknown
4
7
n/a
The ornamental design of a oscilloscope instrument, as shown and described.

FIG. 1 is a perspective view of an oscilloscope instrument;

FIG. 2 is a front elevation view of the oscilloscope instrument;

FIG. 3 is a left side elevation view of the oscilloscope instrument;

FIG. 4 is a right side elevation view of the oscilloscope instrument;

FIG. 5 is a top plan view of the oscilloscope instrument;

FIG. 6 is a bottom plan view of the oscilloscope instrument; and,

FIG. 7 is a rear elevation view of the oscilloscope instrument.

Wrisley, Jerry L.

Patent Priority Assignee Title
D845797, Dec 01 2016 Elma Electronic AG Versatile casing for electronic equipment
D987459, Apr 26 2021 Yokogawa Electric Corporation; Yokogawa Test & Measurement Corporation Spectrum analyzer
ER413,
ER4623,
Patent Priority Assignee Title
6437552, Jul 31 2000 TELEDYNE LECROY, INC Automatic probe identification system
6731104, Dec 05 2002 Tektronix, Inc.; Tektronix, Inc Measurement probe system with EOS/ESD protection
D413823, Jul 28 1998 Tektronix, Inc.; Tektronix, Inc Electronic test and measurement instrument
D420607, Apr 09 1999 Tektronix, Inc. Front panel for a measurement instrument
D460371, Dec 20 2001 Tektronix, Inc. Measurement instrument
D460703, Dec 20 2001 Tektronix, Inc. Measurement instrument
D472171, Dec 20 2001 Tektronix, Inc. Measurement instrument housing
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Apr 30 2004Tektronix, Inc.(assignment on the face of the patent)
Apr 30 2004WRISLEY, JERRY L Tektronix, IncASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0156960483 pdf
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