|
The ornamental design of a housing for test and measurement instruments, as shown and described.
|
The ornamental design disclosed in this application is for a housing for test and measurement instruments, such as oscilloscopes, logic analyzers, waveform generators, and the like. The housing has a substantially rectangular front face with a substantially rectangular opening disposed in a portion thereof, side surfaces having a curved top edges, and a top surface having curved surfaces adjacent to the curved top edges of the side surfaces that transition to a substantially flat surface extending from the front face to the rear surface having a recess formed therein for receiving a recessed handle.
FIG. 1 is a perspective view of a housing for test and measurement instruments;
FIG. 2 is a front elevation view of the housing for test and measurement instruments;
FIG. 3 is a left side elevation view of the housing for test and measurement instruments;
FIG. 4 is a right side elevation view of the housing for test and measurement instruments;
FIG. 5 is a top plan view of the housing for test and measurement instruments;
FIG. 6 is a bottom plan view of the housing for test and measurement instruments; and,
FIG. 7 is a rear elevation view of the housing for test and measurement instruments.
Wrisley, Jerry L., Sugiura, Takashi
Patent | Priority | Assignee | Title |
D514004, | Apr 30 2004 | Tektronix, Inc.; Tektronix, Inc | Waveform generator |
D553520, | Nov 16 2005 | TELEDYNE LECROY, INC | Housing for test and measurement instrument |
Patent | Priority | Assignee | Title |
6437552, | Jul 31 2000 | TELEDYNE LECROY, INC | Automatic probe identification system |
D413823, | Jul 28 1998 | Tektronix, Inc.; Tektronix, Inc | Electronic test and measurement instrument |
D420607, | Apr 09 1999 | Tektronix, Inc. | Front panel for a measurement instrument |
D460371, | Dec 20 2001 | Tektronix, Inc. | Measurement instrument |
D460703, | Dec 20 2001 | Tektronix, Inc. | Measurement instrument |
D472171, | Dec 20 2001 | Tektronix, Inc. | Measurement instrument housing |
Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
Apr 22 2004 | SUGIURA, TAKASHI | Tektronix, Inc | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 015933 | /0771 | |
Apr 30 2004 | Tektronix, Inc. | (assignment on the face of the patent) | / | |||
Apr 30 2004 | WRISLEY, JERRY L | Tektronix, Inc | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 015933 | /0771 |
Date | Maintenance Fee Events |
Date | Maintenance Schedule |