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The ornamental design of a housing for test and measurement instruments, as shown and described.
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The ornamental design disclosed in this application is for a housing for test and measurement instruments, such as oscilloscopes, logic analyzers, waveform generators, and the like.
FIG. 1 is a perspective view of a housing for test and measurement instruments;
FIG. 2 is a front elevation view of the housing for test and measurement instruments;
FIG. 3 is a left side elevation view of the housing for test and measurement instruments;
FIG. 4 is a right side elevation view of the housing for test and measurement instruments;
FIG. 5 is a top plan view of the housing for test and measurement instruments;
FIG. 6 is a bottom plan view of the housing for test and measurement instruments; and,
FIG. 7 is a rear elevation view of the housing for test and measurement instruments.
| Patent | Priority | Assignee | Title |
| D514004, | Apr 30 2004 | Tektronix, Inc.; Tektronix, Inc | Waveform generator |
| D553520, | Nov 16 2005 | TELEDYNE LECROY, INC | Housing for test and measurement instrument |
| ER8479, |
| Patent | Priority | Assignee | Title |
| 6437552, | Jul 31 2000 | TELEDYNE LECROY, INC | Automatic probe identification system |
| D413823, | Jul 28 1998 | Tektronix, Inc.; Tektronix, Inc | Electronic test and measurement instrument |
| D420607, | Apr 09 1999 | Tektronix, Inc. | Front panel for a measurement instrument |
| D460371, | Dec 20 2001 | Tektronix, Inc. | Measurement instrument |
| D460703, | Dec 20 2001 | Tektronix, Inc. | Measurement instrument |
| D472171, | Dec 20 2001 | Tektronix, Inc. | Measurement instrument housing |
| Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
| Apr 30 2004 | Tektronix, Inc. | (assignment on the face of the patent) | / | |||
| Apr 30 2004 | WRISLEY, JERRY L | Tektronix, Inc | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 015933 | /0761 |
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