Patent
   D947693
Priority
Sep 20 2019
Filed
Sep 20 2019
Issued
Apr 05 2022
Expiry
Apr 05 2037
Assg.orig
Entity
unknown
5
83
n/a
The ornamental design for a measurement probe head assembly, as shown and described.

FIG. 1 is a front-side isometric view of a measurement probe head assembly in an operating environment.

FIG. 2 is a front-side isometric view of the measurement probe head assembly of FIG. 1 resting in a stand.

FIG. 3 is a front-side isometric view of a measurement probe head assembly of FIG. 1.

FIG. 4 is a front view of the measurement probe head assembly of FIG. 1.

FIG. 5 is a rear view of the measurement probe head assembly of FIG. 1.

FIG. 6 is a top view of the measurement probe head assembly of FIG. 1.

FIG. 7 is a first-side view of the measurement probe head assembly of FIG. 1.

FIG. 8 is a bottom view of the measurement probe head assembly of FIG. 1; and,

FIG. 9 is a second-side view of the measurement probe head assembly of FIG. 1.

Environmental portions of the measurement probe head assembly and stand are shown in broken lines and form no part of the claimed design.

Mende, Michael J., Rinder, Karl A., Engquist, David Thomas, Vermilyea, Heather J., Tarr, Tony Lee

Patent Priority Assignee Title
D968987, Feb 21 2022 Soil tester
ER1276,
ER3605,
ER422,
ER4544,
Patent Priority Assignee Title
10094868, Apr 11 2014 Tektronix, Inc.; Tektronix, Inc Test and measurement instrument having advanced triggering capability
10107649, Sep 22 2009 Tektronix, Inc Test and measurement instrument using combined signals
10330705, Dec 16 2015 Tektronix, Inc Calibration for test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing
10559173, Mar 11 2015 Non-contact voltage detector
5149182, May 02 1991 Tektronix, Inc. Optical filter for an optical measurement instrument
5406067, Aug 17 1993 Tektronix, Inc. Electrically adjusted mosaic filter for use as an optical sensor in an optical measurement instrument
5491548, Mar 18 1994 Tektronix, Inc Optical signal measurement instrument and wide dynamic range optical receiver for use therein
6088029, Jun 26 1998 Tektronix, Inc.; Tektronix, Inc Enhanced display of a control window in a measurement instrument
6229456, Aug 10 1998 Tektronix, Inc.; Tektronix, Inc Method and apparatus for facilitating user interaction with a measurement instrument using a display-based control knob
6297796, Oct 08 1998 Tektronix, Inc.; Tektronix, Inc Ink saver apparatus and method for use in a test and measurement instrument
6321171, Apr 03 1998 Tektronix, Inc. Electronic measurement instrument probe accessory offset, gain, and linearity correction method
6336592, Dec 09 1999 Tektronix, Inc.; Tektronix, Inc Thermal control for a test and measurement instrument
6615148, May 17 2000 Tektronix, Inc.; Tektronix, Inc Streaming distributed test and measurement instrument
6642926, Sep 24 1999 Tektronix, Inc.; Tektronix, Inc Test and measurement instrument having telecommunications mask testing capability with a mask zoom feature
6681191, Dec 21 1999 Tektronix, Inc. Frequency domain analysis system for a time domain measurement instrument
6693576, May 23 2002 Tektronix, Inc.; Tektronix, Inc Methods and apparatus providing multiple concurrent acquisition modes in a digitizing measurement instrument
6728648, Sep 24 1999 Tektronix, Inc.; Tektronix, Inc Test and measurement instrument having telecommunications mask testing capability with an autofit to mask feature
6778931, Sep 24 1999 Tektronix, Inc.; Tektronix, Inc Test and measurement instrument having multi-channel telecommunications mask testing capability
7474972, Mar 23 2007 Tektronix, Inc Bandwidth multiplication for a test and measurement instrument using non-periodic functions for mixing
7529641, Apr 21 2006 Tektronix, Inc.; Tektronix, Inc Mixed signal display for a measurement instrument
7734442, Apr 23 2007 Tektronix, Inc Apparatus and method for a test and measurement instrument
8024141, Sep 04 2009 Tektronix, Inc Test and measurement instrument and method for providing post-acquisition trigger control and presentation
8055464, Sep 08 2008 Tektronix, Inc Method of processing waveform data from one or more channels using a test and measurement instrument
8089293, Apr 20 2009 Tektronix, Inc Test and measurement instrument and method of configuring using a sensed impedance
8103473, Nov 12 2007 Tektronix, Inc Test and measurement instrument and method of calibrating
8228072, Apr 23 2009 Tektronix, Inc Test and measurement instrument with an automatic threshold control
8324885, Sep 17 2009 Tektronix, Inc.; Tektronix, Inc Mixed signal acquisition system for a measurement instrument
8335950, Aug 12 2009 Tektronix, Inc Test and measurement instrument with bit-error detection
8461850, Aug 13 2010 Tektronix, Inc Time-domain measurements in a test and measurement instrument
8521460, Sep 28 2010 Tektronix, Inc Multi-domain test and measurement instrument
8615382, Jan 27 2011 Tektronix, Inc Test and measurement instrument with common presentation of time domain data
8649989, Aug 13 2010 Tektronix, Inc Time-domain triggering in a test and measurement instrument
8675719, Sep 28 2010 Tektronix, Inc Multi-domain test and measurement instrument
8742749, May 26 2011 Tektronix, Inc Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing
8793536, Aug 22 2012 Tektronix, Inc Test and measurement instrument with auto-sync for bit-error detection
8818744, Oct 16 2008 Tektronix, Inc Test and measurement instrument and method of switching waveform display styles
8924175, Mar 09 2009 Tektronix, Inc. Apparatus and method for performing burst triggering in a test and measurement instrument
9020016, Sep 28 2010 Tektronix, Inc. Multi-domain test and measurement instrument
9026390, Sep 06 2011 Tektronix, Inc Interleaved RF triggering on a test and measurement instrument
9075696, Mar 09 2009 Tektronix, Inc Apparatus and method for performing burst triggering in a test and measurement instrument
9134347, Oct 01 2012 Tektronix, Inc Rare anomaly triggering in a test and measurement instrument
9157943, Aug 13 2010 Tektronix, Inc Multi-channel frequency domain test and measurement instrument
9207269, May 22 2012 Tektronix, Inc Automatically detecting in-band but out-of-span power in a frequency-domain test and measurement instrument
9239343, Jun 06 2011 Tektronix, Inc Interleaved digital down-conversion on a test and measurement instrument
9291646, Jul 27 2012 Tektronix, Inc Cross domain triggering in a test and measurement instrument
9297834, Aug 13 2010 Tektronix, Inc Time-domain searching in a test and measurement instrument
9306590, May 26 2011 Tektronix, Inc.; Tektronix, Inc Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing
9432042, May 26 2011 Tektronix, Inc.; Tektronix, Inc Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing
9525427, Sep 11 2015 Tektronix, Inc. Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing and a linear time-periodic filter
9529017, Oct 16 2008 Tektronix, Inc. Test and measurement instrument and method of switching waveform display styles
9568503, May 26 2011 Tektronix, Inc. Calibration for test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing
9714956, Dec 13 2012 Tektronix, Inc Test and measurement instrument user interface with move mode
9858240, Dec 13 2012 Tektronix, Inc Automatic center frequency and span setting in a test and measurement instrument
9859908, Sep 11 2015 Tektronix, Inc Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing and a linear time-periodic filter
9934355, Mar 09 2009 Tektronix, Inc. Apparatus and method for performing burst triggering in a test and measurement instrument
20160187383,
D354923, Jan 31 1994 Tektronix, Inc.; Tektronix, Inc Probing head for an electrical test probe
D365997, Mar 03 1995 Tektronix, Inc.; Tektronix, Inc Hand-held measurement instrument with grip
D366432, Mar 03 1995 Tektronix, Inc.; Tektronix, Inc Electronic measurement instrument
D400457, Jan 22 1998 Fluke Electronics Corporation Display bezel for a hand-held electronic measurement instrument
D401521, Jan 22 1998 Fluke Electronics Corporation Hand-held electronic measurement instrument
D401875, Jan 22 1998 Fluke Electronics Corporation Button configuration in a hand-held electronic measurement instrument
D404664, Jan 22 1998 Fluke Electronics Corporation Recessed display bezel for a hand-held electronic measurement instrument
D404665, Jan 22 1998 Fluke Electronics Corporation Hand-held electronic measurement instrument
D404666, Jan 22 1998 Fluke Electronics Corporation Raised display bezel for a hand-held electronic measurement instrument
D413823, Jul 28 1998 Tektronix, Inc.; Tektronix, Inc Electronic test and measurement instrument
D420607, Apr 09 1999 Tektronix, Inc. Front panel for a measurement instrument
D443538, Mar 13 2000 Tektronix, Inc.; Tektronix, Inc Processor and display module for a modular measurement instrument
D444084, Mar 13 2000 Tektronix, Inc Modular measurement instrument
D444085, Mar 13 2000 Tektronix, Inc.; Tektronix, Inc Processor and display module for a modular measurement instrument
D444086, Mar 13 2000 Tektronix, Inc.; Tektronix, Inc Modular measurement instrument
D460371, Dec 20 2001 Tektronix, Inc. Measurement instrument
D460703, Dec 20 2001 Tektronix, Inc. Measurement instrument
D472171, Dec 20 2001 Tektronix, Inc. Measurement instrument housing
D663636, Apr 22 2011 Tektronix, Inc Front panel for a measurement instrument
D664458, Apr 22 2011 Tektronix, Inc Input/output connector receptacles for a measurement instrument
D671021, May 05 2011 Tektronix, Inc RF input/output connector receptacle and control buttons for a measurement instrument
D677184, Sep 06 2011 FORTRESS CREDIT CORP , AS AGENT Portable measurement instrument
D786108, Jan 12 2016 Tektronix, Inc.; Tektronix, Inc Browser probe assembly
D808832, Feb 29 2016 Tektronix, Inc.; Tektronix, Inc Measurement system with controller and sensor head
D820127, Nov 21 2014 Tektronix, Inc. Housing for a test and measurement instrument
D820129, Nov 21 2014 Tektronix, Inc. Front panel for a measurement instrument
D821234, Jul 11 2016 Tektronix, Inc Multi-channel measurement instrument housing
//////
Executed onAssignorAssigneeConveyanceFrameReelDoc
Sep 20 2019Tektronix, Inc.(assignment on the face of the patent)
Sep 25 2019TARR, TONY LEETektronix, IncASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0516820546 pdf
Sep 26 2019ENGQUIST, DAVID THOMASTektronix, IncASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0516820546 pdf
Sep 27 2019VERMILYEA, HEATHER J Tektronix, IncASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0516820546 pdf
Sep 27 2019MENDE, MICHAEL J Tektronix, IncASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0516820546 pdf
Jan 28 2020RINDER, KARL A Tektronix, IncASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0516820546 pdf
n/a
Date Maintenance Fee Events


n/a
Date Maintenance Schedule