Patent
   D821234
Priority
Jul 11 2016
Filed
Jul 11 2016
Issued
Jun 26 2018
Expiry
Jun 26 2033
Assg.orig
Entity
unknown
1
4
n/a
The ornamental design for a multi-channel measurement instrument housing, as shown and described.

FIG. 1 is a perspective view of the multi-channel measurement instrument housing having two channels.

FIG. 2 is a front view of the multi-channel measurement instrument housing of FIG. 1.

FIG. 3 is a rear view of the multi-channel measurement instrument housing of FIG. 1.

FIG. 4 is a left side view of the multi-channel measurement instrument housing of FIG. 1.

FIG. 5 is a right side view of the multi-channel measurement instrument housing of FIG. 1.

FIG. 6 is a top view of the multi-channel measurement instrument housing of FIG. 1.

FIG. 7 is a bottom view of the multi-channel measurement instrument housing of FIG. 1.

FIG. 8 is a perspective view of an alternative embodiment of the multi-channel measurement instrument housing having two channels.

FIG. 9 is a front view of the multi-channel measurement instrument housing of FIG. 8.

FIG. 10 is a rear view of the multi-channel measurement instrument housing of FIG. 8.

FIG. 11 is a left side view of the multi-channel measurement instrument housing of FIG. 8.

FIG. 12 is a right side view of the multi-channel measurement instrument housing of FIG. 8.

FIG. 13 is a top view of the multi-channel measurement instrument housing of FIG. 8.

FIG. 14 is a bottom view of the multi-channel measurement instrument housing of FIG. 8.

FIG. 15 is a perspective view of an alternative embodiment of the multi-channel measurement instrument housing having four channels.

FIG. 16 is a front view of the multi-channel measurement instrument housing of FIG. 15.

FIG. 17 is a rear view of the multi-channel measurement instrument housing of FIG. 15.

FIG. 18 is a left side view of the multi-channel measurement instrument housing of FIG. 15.

FIG. 19 is a right side view of the multi-channel measurement instrument housing of FIG. 15.

FIG. 20 is a top view of the multi-channel measurement instrument housing of FIG. 15.

FIG. 21 is a bottom view of the multi-channel measurement instrument housing of FIG. 15.

FIG. 22 is a perspective view of an alternative embodiment of the multi-channel measurement instrument housing having four channels.

FIG. 23 is a front view of the multi-channel measurement instrument housing of FIG. 22.

FIG. 24 is a rear view of the multi-channel measurement instrument housing of FIG. 22.

FIG. 25 is a left side view of the multi-channel measurement instrument housing of FIG. 22.

FIG. 26 is a right side view of the multi-channel measurement instrument housing of FIG. 22.

FIG. 27 is a top view of the multi-channel measurement instrument housing of FIG. 22; and,

FIG. 28 is a bottom view of the multi-channel measurement instrument housing of FIG. 22.

The portions of the multi-channel measurement instrument housing shown in broken lines form no part of the claimed design.

Li, Wenqing, Chen, Wengfang

Patent Priority Assignee Title
D947693, Sep 20 2019 Tektronix, Inc Measurement probe head assembly
Patent Priority Assignee Title
CN303207807,
D472171, Dec 20 2001 Tektronix, Inc. Measurement instrument housing
D514004, Apr 30 2004 Tektronix, Inc.; Tektronix, Inc Waveform generator
TW143729,
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Jul 11 2016Tektronix, Inc.(assignment on the face of the patent)
Jul 12 2016LI, WENQINGTektronix, IncASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0391320799 pdf
Jul 12 2016CHEN, WENFANGTektronix, IncASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0391320799 pdf
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