Patent
   D614151
Priority
Apr 04 2008
Filed
Oct 06 2008
Issued
Apr 20 2010
Expiry
Apr 20 2024
Assg.orig
Entity
unknown
4
5
n/a
The ornamental design for a microchip probe, as shown.

FIG. 1 is a front elevational view of a microchip probe, in accordance with my new design;

FIG. 2 is a rear elevational view of the microchip probe of FIG. 1;

FIG. 3 is a left side elevational view of the microchip probe of FIG. 1;

FIG. 4 is a right side elevational view of the microchip probe of FIG. 1;

FIG. 5 is a top plan view of the microchip probe of FIG. 1;

FIG. 6 is a bottom plan view of the microchip probe of FIG. 1; and,

FIG. 7 is an enlarged, detailed, front elevational view of the microchip probe of FIG. 1, showing a portion of the front surface of the microchip probe.

Petersen, Christian L.

Patent Priority Assignee Title
9644939, Dec 21 2010 CAPRES A S Single-position hall effect measurements
D989342, Feb 04 2020 UT-Battelle, LLC Microfluidic polymer chip interface bracket
ER1915,
ER6452,
Patent Priority Assignee Title
6211685, Aug 27 1998 Advanced Micro Devices Surface probe for determining physical properties of a semiconductor device
7442571, May 08 2002 Samsung Electronics Co., Ltd. Semiconductor probe with resistive tip and method of fabricating the same, and information recording apparatus, information reproducing apparatus, and information measuring apparatus having the semiconductor probe
20090085591,
20090167334,
D602885, Apr 04 2008 CAPRES A S Connector for a microchip probe
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