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Patent
D764331
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Priority
Dec 04 2014
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Filed
Jun 02 2015
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Issued
Aug 23 2016
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Expiry
Aug 23 2031
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Assg.orig
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Entity
unknown
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1
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15
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n/a
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The ornamental design for a probe pin, as shown and described.
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FIG. 1 is a top front perspective view of a probe pin showing our new design;
FIG. 2 is a front view thereof;
FIG. 3 is a rear view thereof;
FIG. 4 is a left side view thereof;
FIG. 5 is a right side view thereof;
FIG. 6 is a top view thereof; and,
FIG. 7 is a bottom view thereof.
The shade lines in the figures show contour and not surface ornamentation.
Sakai, Takahiro, Teranishi, Hirotada
Patent |
Priority |
Assignee |
Title |
ER6991, |
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Patent |
Priority |
Assignee |
Title |
8366496, |
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8460010, |
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8669774, |
Apr 09 2010 |
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8808038, |
Nov 11 2009 |
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9130290, |
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9322846, |
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229184, |
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D507197, |
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Measure tape |
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Kabushiki Kaisha Nihon Micronics |
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D749968, |
Jan 24 2014 |
Fluke Precision Measurement LTD |
Electrical test lead |
D750987, |
Jan 24 2014 |
Fluke Precision Measurement LTD |
Interactive test probe for battery tester |
KR300653160, |
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WO2007097559, |
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Date |
Maintenance Fee Events |
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Maintenance Schedule |
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