Patent
   D749968
Priority
Jan 24 2014
Filed
Jul 23 2014
Issued
Feb 23 2016
Expiry
Feb 23 2030
Assg.orig
Entity
unknown
17
6
n/a
The ornamental design for an electrical test lead, as shown and described.

FIG. 1 is a top front left isometric view of an electrical test lead showing our new design;

FIG. 2 is a top plan view thereof;

FIG. 3 is a bottom plan view thereof;

FIG. 4 is a rear elevation view thereof;

FIG. 5 is a front elevation view thereof;

FIG. 6 is an inverted right side elevation view thereof;

FIG. 7 is a left side elevation view thereof; and,

FIG. 8 is a top rear left isometric view thereof.

Huang, Wei, Shen, Yurui

Patent Priority Assignee Title
D764330, Dec 04 2014 Omron Corporation Probe pin
D764331, Dec 04 2014 Omron Corporation Probe pin
D764332, Dec 04 2014 Omron Corporation Probe pin
D769747, Dec 15 2014 Omron Corporation Probe pin
D769748, Dec 15 2014 Omron Corporation Probe pin
D769749, Dec 19 2014 Omron Corporation Probe pin
D769750, Sep 15 2015 Omron Corporation Probe pin
D769751, Dec 15 2014 Omron Corporation Probe pin
D769752, Dec 15 2014 Omron Corporation Probe pin
D769753, Dec 19 2014 Omron Corporation Probe pin
D769754, Sep 15 2015 Omron Corporation Probe pin
D775984, Mar 04 2015 Omron Corporation Probe pin
D776551, Dec 15 2014 Omron Corporation Probe pin
D776552, Dec 15 2014 Omron Corporation Probe pin
D810598, Jan 24 2014 Fluke Precision Measurement Ltd. Interactive test probe for battery tester
D811911, Nov 11 2015 Fluke Corporation AC clamp accessory
D852660, Nov 11 2015 Fluke Corporation AC clamp accessory
Patent Priority Assignee Title
5136234, Oct 04 1990 Hastings Fiber Glass Products, Inc. Digital high-voltage meter device
9030220, Oct 12 2011 Fluke Corporation Voltage tester having alternatively attachable or separable probes
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D474415, Jul 16 2002 Snap-on Technologies, Inc. Test lead head
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Jul 17 2014HUANG, WEIDANAHER SHANGHAI INDUSTRIAL INSTRUMENTATION TECHNOLOGIES R&D CO , LTD ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0334400162 pdf
Jul 17 2014SHEN, YURUIDANAHER SHANGHAI INDUSTRIAL INSTRUMENTATION TECHNOLOGIES R&D CO , LTD ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0334400162 pdf
Jul 23 2014Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd.(assignment on the face of the patent)
Mar 31 2016DANAHER SHANGHAI INDUSTRIAL INSTRUMENTATION TECHNOLOGIES R&D CO , LTD SHANGHAI SHILU INSTRUMENTS CO , LTD ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0383090566 pdf
Jun 06 2016DANAHER SHANGHAI INDUSTRIAL INSTRUMENTATION TECHNOLOGIES R&D CO , LTD SHANGHAI SHILU INSTRUMENT CO , LTD ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0389220820 pdf
Jun 24 2016SHANGHAI SHILU INSTRUMENT CO , LTD Fluke Precision Measurement LTDASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0397410396 pdf
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