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Patent
D749968
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Priority
Jan 24 2014
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Filed
Jul 23 2014
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Issued
Feb 23 2016
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Expiry
Feb 23 2030
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Assg.orig
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Entity
unknown
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17
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6
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n/a
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The ornamental design for an electrical test lead, as shown and described.
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FIG. 1 is a top front left isometric view of an electrical test lead showing our new design;
FIG. 2 is a top plan view thereof;
FIG. 3 is a bottom plan view thereof;
FIG. 4 is a rear elevation view thereof;
FIG. 5 is a front elevation view thereof;
FIG. 6 is an inverted right side elevation view thereof;
FIG. 7 is a left side elevation view thereof; and,
FIG. 8 is a top rear left isometric view thereof.
Huang, Wei, Shen, Yurui
Patent |
Priority |
Assignee |
Title |
D764330, |
Dec 04 2014 |
Omron Corporation |
Probe pin |
D764331, |
Dec 04 2014 |
Omron Corporation |
Probe pin |
D764332, |
Dec 04 2014 |
Omron Corporation |
Probe pin |
D769747, |
Dec 15 2014 |
Omron Corporation |
Probe pin |
D769748, |
Dec 15 2014 |
Omron Corporation |
Probe pin |
D769749, |
Dec 19 2014 |
Omron Corporation |
Probe pin |
D769750, |
Sep 15 2015 |
Omron Corporation |
Probe pin |
D769751, |
Dec 15 2014 |
Omron Corporation |
Probe pin |
D769752, |
Dec 15 2014 |
Omron Corporation |
Probe pin |
D769753, |
Dec 19 2014 |
Omron Corporation |
Probe pin |
D769754, |
Sep 15 2015 |
Omron Corporation |
Probe pin |
D775984, |
Mar 04 2015 |
Omron Corporation |
Probe pin |
D776551, |
Dec 15 2014 |
Omron Corporation |
Probe pin |
D776552, |
Dec 15 2014 |
Omron Corporation |
Probe pin |
D810598, |
Jan 24 2014 |
Fluke Precision Measurement Ltd. |
Interactive test probe for battery tester |
D811911, |
Nov 11 2015 |
Fluke Corporation |
AC clamp accessory |
D852660, |
Nov 11 2015 |
Fluke Corporation |
AC clamp accessory |
Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
Jul 17 2014 | HUANG, WEI | DANAHER SHANGHAI INDUSTRIAL INSTRUMENTATION TECHNOLOGIES R&D CO , LTD | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 033440 | /0162 |
pdf |
Jul 17 2014 | SHEN, YURUI | DANAHER SHANGHAI INDUSTRIAL INSTRUMENTATION TECHNOLOGIES R&D CO , LTD | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 033440 | /0162 |
pdf |
Jul 23 2014 | | Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. | (assignment on the face of the patent) | | / |
Mar 31 2016 | DANAHER SHANGHAI INDUSTRIAL INSTRUMENTATION TECHNOLOGIES R&D CO , LTD | SHANGHAI SHILU INSTRUMENTS CO , LTD | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 038309 | /0566 |
pdf |
Jun 06 2016 | DANAHER SHANGHAI INDUSTRIAL INSTRUMENTATION TECHNOLOGIES R&D CO , LTD | SHANGHAI SHILU INSTRUMENT CO , LTD | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 038922 | /0820 |
pdf |
Jun 24 2016 | SHANGHAI SHILU INSTRUMENT CO , LTD | Fluke Precision Measurement LTD | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 039741 | /0396 |
pdf |
Date |
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