Patent
   D775984
Priority
Mar 04 2015
Filed
Aug 18 2015
Issued
Jan 10 2017
Expiry
Jan 10 2032
Assg.orig
Entity
unknown
2
15
n/a
The ornamental design for a probe pin, as shown and described.

FIG. 1 is a perspective view of a probe pin;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a top plan view thereof;

FIG. 7 is a bottom plan view thereof;

FIG. 8 is a perspective view of another probe pin;

FIG. 9 is a front elevational view thereof;

FIG. 10 is a rear elevational view thereof;

FIG. 11 is a left side view thereof;

FIG. 12 is a right side view thereof;

FIG. 13 is a top plan view thereof; and,

FIG. 14 is a bottom plan view thereof.

The dashed broken lines in the figures show portions of the probe pin that form no part of the claimed design.

The dot-dash broken lines in the figures show boundaries of the claimed design.

The shade lines in the figures show contour and not surface ornamentation.

Sakai, Takahiro, Teranishi, Hirotada

Patent Priority Assignee Title
D942290, Jul 12 2019 Johnstech International Corporation Tip for integrated circuit test pin
ER6991,
Patent Priority Assignee Title
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Jul 30 2015TERANISHI, HIROTADAOmron CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0368680527 pdf
Jul 30 2015SAKAI, TAKAHIROOmron CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0368680527 pdf
Aug 18 2015Omron Corporation(assignment on the face of the patent)
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