Patent
   D764332
Priority
Dec 04 2014
Filed
Jun 02 2015
Issued
Aug 23 2016
Expiry
Aug 23 2031
Assg.orig
Entity
unknown
0
18
n/a
The ornamental design for a probe pin, as shown and described.

FIG. 1 is a top front perspective view of a probe pin showing our new design;

FIG. 2 is a front view thereof;

FIG. 3 is a rear view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a top view thereof; and,

FIG. 7 is a bottom view thereof.

The dashed broken lines in the figures show portions of the probe pin that form no part of the claimed design.

The dot-dash broken lines in the figures show boundaries of the claimed design.

The shade lines in the figures show contour and not surface ornamentation.

Sakai, Takahiro, Teranishi, Hirotada

Patent Priority Assignee Title
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Jun 02 2015Omron Corporation(assignment on the face of the patent)
Jul 28 2015TERANISHI, HIROTADAOmron CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0367670557 pdf
Jul 28 2015SAKAI, TAKAHIROOmron CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0367670557 pdf
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