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Patent
D764332
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Priority
Dec 04 2014
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Filed
Jun 02 2015
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Issued
Aug 23 2016
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Expiry
Aug 23 2031
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Assg.orig
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Entity
unknown
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0
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18
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n/a
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The ornamental design for a probe pin, as shown and described.
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FIG. 1 is a top front perspective view of a probe pin showing our new design;
FIG. 2 is a front view thereof;
FIG. 3 is a rear view thereof;
FIG. 4 is a left side view thereof;
FIG. 5 is a right side view thereof;
FIG. 6 is a top view thereof; and,
FIG. 7 is a bottom view thereof.
The dashed broken lines in the figures show portions of the probe pin that form no part of the claimed design.
The dot-dash broken lines in the figures show boundaries of the claimed design.
The shade lines in the figures show contour and not surface ornamentation.
Sakai, Takahiro, Teranishi, Hirotada
Patent |
Priority |
Assignee |
Title |
Patent |
Priority |
Assignee |
Title |
8366496, |
Mar 18 2010 |
Hon Hai Precision Ind. Co., Ltd. |
Composite contact assembly having lower contact with contact engaging points offset from each other |
8460010, |
Sep 28 2009 |
Kabushiki Kaisha Nihon Micronics |
Contact and electrical connecting apparatus |
8669774, |
Apr 09 2010 |
Yamaichi Electronics Co., Ltd.; YAMAICHI ELECTRONICS CO , LTD |
Probe pin and an IC socket with the same |
8808038, |
Nov 11 2009 |
HICON CO , LTD ; HWANG, DONG WEON |
Spring contact and a socket embedded with spring contacts |
9130290, |
Oct 14 2011 |
Omron Corporation |
Bellows body contactor having a fixed touch piece |
9322846, |
Oct 14 2011 |
Omron Corporation |
Contactor |
133267, |
|
|
|
229184, |
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|
|
D325564, |
Oct 11 1989 |
|
Retainer for securing electrical plugs to an outlet |
D507197, |
Nov 22 2004 |
|
Measure tape |
D662895, |
Jan 27 2010 |
Kabushiki Kaisha Nihon Micronics |
Electric contact |
D665744, |
Sep 28 2010 |
Adamant Kogyo Co., Ltd. |
Optical fiber connector |
D665745, |
Sep 28 2010 |
Adamant Kogyo Co., Ltd. |
Optical fiber connector |
D749968, |
Jan 24 2014 |
Fluke Precision Measurement LTD |
Electrical test lead |
D750987, |
Jan 24 2014 |
Fluke Precision Measurement LTD |
Interactive test probe for battery tester |
KR300653160, |
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KR300735080, |
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WO2007097559, |
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Date |
Maintenance Fee Events |
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Maintenance Schedule |
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