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Patent
D776552
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Priority
Dec 15 2014
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Filed
Jun 15 2015
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Issued
Jan 17 2017
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Expiry
Jan 17 2032
TERM.DISCL.
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Assg.orig
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Entity
unknown
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16
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15
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n/a
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The ornamental design for a probe pin, as shown and described.
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FIG. 1 is a perspective view of a probe pin;
FIG. 2 is a front elevation view thereof;
FIG. 3 is a rear elevation view thereof;
FIG. 4 is a left side view thereof;
FIG. 5 is a right side view thereof;
FIG. 6 is a top plan view thereof; and,
FIG. 7 is a bottom plan view thereof.
Sakai, Takahiro, Teranishi, Hirotada
Patent |
Priority |
Assignee |
Title |
9797925, |
Jun 16 2014 |
Omron Corporation |
Probe pin and electronic device using the same |
D847757, |
Aug 30 2017 |
Kabushiki Kaisha Nihon Micronics |
Probe pin |
D867183, |
Feb 10 2017 |
Kabushiki Kaisha Nihon Micronics |
Probe pin |
D869305, |
Feb 10 2017 |
Kabushiki Kaisha Nihon Micronics |
Probe pin |
D873159, |
Feb 02 2018 |
Kabushiki Kaisha Nihon Micronics |
Electric contact |
D873160, |
Feb 02 2018 |
Kabushiki Kaisha Nihon Micronics |
Electric contact |
D873161, |
Feb 02 2018 |
Kabushiki Kaisha Nihon Micronics |
Electric contact |
D873683, |
Feb 02 2018 |
Kabushiki Kaisha Nihon Micronics |
Electric contact |
D873684, |
Feb 02 2018 |
Kabushiki Kaisha Nihon Micronics |
Electric contact |
D873685, |
Feb 02 2018 |
Kabushiki Kaisha Nihon Micronics |
Electric contact |
D873686, |
Feb 02 2018 |
Kabushiki Kaisha Nihon Micronics |
Electric contact |
D874958, |
Feb 02 2018 |
Kabushiki Kaisha Nihon Micronics |
Electric contact |
D894025, |
May 16 2018 |
Nidec-Read Corporation; SV PROBE TECHNOLOGY TAIWAN CO , LTD |
Electric characteristic measuring probe |
D942290, |
Jul 12 2019 |
Johnstech International Corporation |
Tip for integrated circuit test pin |
D983681, |
Dec 03 2020 |
MPI Corporation |
Probe for testing device under test |
ER6991, |
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Patent |
Priority |
Assignee |
Title |
8366496, |
Mar 18 2010 |
Hon Hai Precision Ind. Co., Ltd. |
Composite contact assembly having lower contact with contact engaging points offset from each other |
8460010, |
Sep 28 2009 |
Kabushiki Kaisha Nihon Micronics |
Contact and electrical connecting apparatus |
8669774, |
Apr 09 2010 |
Yamaichi Electronics Co., Ltd.; YAMAICHI ELECTRONICS CO , LTD |
Probe pin and an IC socket with the same |
8808038, |
Nov 11 2009 |
HICON CO , LTD ; HWANG, DONG WEON |
Spring contact and a socket embedded with spring contacts |
9130290, |
Oct 14 2011 |
Omron Corporation |
Bellows body contactor having a fixed touch piece |
9322846, |
Oct 14 2011 |
Omron Corporation |
Contactor |
229184, |
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|
D507197, |
Nov 22 2004 |
|
Measure tape |
D662895, |
Jan 27 2010 |
Kabushiki Kaisha Nihon Micronics |
Electric contact |
D665744, |
Sep 28 2010 |
Adamant Kogyo Co., Ltd. |
Optical fiber connector |
D665745, |
Sep 28 2010 |
Adamant Kogyo Co., Ltd. |
Optical fiber connector |
D749968, |
Jan 24 2014 |
Fluke Precision Measurement LTD |
Electrical test lead |
D750987, |
Jan 24 2014 |
Fluke Precision Measurement LTD |
Interactive test probe for battery tester |
JP2011232181, |
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TW157152, |
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Date |
Maintenance Fee Events |
n/a
Date |
Maintenance Schedule |
n/a