Patent
   D776552
Priority
Dec 15 2014
Filed
Jun 15 2015
Issued
Jan 17 2017
Expiry
Jan 17 2032

TERM.DISCL.
Assg.orig
Entity
unknown
16
15
n/a
The ornamental design for a probe pin, as shown and described.

FIG. 1 is a perspective view of a probe pin;

FIG. 2 is a front elevation view thereof;

FIG. 3 is a rear elevation view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

Sakai, Takahiro, Teranishi, Hirotada

Patent Priority Assignee Title
9797925, Jun 16 2014 Omron Corporation Probe pin and electronic device using the same
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D942290, Jul 12 2019 Johnstech International Corporation Tip for integrated circuit test pin
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ER6991,
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Jun 11 2015TERANISHI, HIROTADAOmron CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0392350772 pdf
Jun 11 2015SAKAI, TAKAHIROOmron CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0392350772 pdf
Jun 15 2015Omron Corporation(assignment on the face of the patent)
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