Patent
   D894025
Priority
May 16 2018
Filed
Nov 16 2018
Issued
Aug 25 2020
Expiry
Aug 25 2035
Assg.orig
Entity
unknown
2
8
n/a
The ornamental design for an electric characteristic measuring probe, as shown and described.

FIG. 1 is a perspective view of an electric characteristic measuring probe, showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a right side elevational view thereof;

FIG. 5 is a left side elevational view thereof;

FIG. 6 is a top plan view thereof;

FIG. 7 is a bottom plan view thereof;

FIG. 8 is an enlarged top plan view thereof;

FIG. 9 is an enlarged bottom plan view thereof;

FIG. 10 is an enlarged partial perspective view thereof, taken along line 10-10 of FIG. 1;

FIG. 11 is a an enlarged cross-sectional view thereof, taken along line 11-11 of FIG. 2;

FIG. 12 is an enlarged partial front elevational view thereof, taken along line 12-12 of FIG. 2; and,

FIG. 13 is an enlarged partial right side elevational view thereof, taken along line 13-13 of FIG. 4.

The broken line portions of the design are included to show unclaimed portions and form no part of the claimed design. Annotated drawings showing one non-limiting example of the article in use is provided in the accompanying Appendix, which may be deleted prior to printing of any patent that grants from the present application.

Kaida, Michio, Yu, Huei Che

Patent Priority Assignee Title
D983681, Dec 03 2020 MPI Corporation Probe for testing device under test
ER6991,
Patent Priority Assignee Title
10132833, Jul 09 2013 FormFactor, Inc Multipath electrical probe and probe assemblies with signal paths through secondary paths between electrically conductive guide plates
7671610, Oct 19 2007 MICROPROBE, INC Vertical guided probe array providing sideways scrub motion
D507198, Jun 11 2003 SV Probe Pte Ltd Straight protruding probe beam contour surfaces
D510043, Jun 11 2003 SV Probe Pte Ltd Continuously profiled probe beam
D769748, Dec 15 2014 Omron Corporation Probe pin
D769749, Dec 19 2014 Omron Corporation Probe pin
D776551, Dec 15 2014 Omron Corporation Probe pin
D776552, Dec 15 2014 Omron Corporation Probe pin
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Nov 12 2018KAIDA, MICHIONidec-Read CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0482540412 pdf
Nov 12 2018KAIDA, MICHIOSV PROBE TECHNOLOGY TAIWAN CO , LTD ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0482540412 pdf
Nov 16 2018Nidec-Read Corporation(assignment on the face of the patent)
Nov 16 2018SV PROBE TECHNOLOGY TAIWAN CO., LTD.(assignment on the face of the patent)
Jan 08 2019YU, HUEI CHENidec-Read CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0482540412 pdf
Jan 08 2019YU, HUEI CHESV PROBE TECHNOLOGY TAIWAN CO , LTD ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0482540412 pdf
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