Patent
   D507198
Priority
Jun 11 2003
Filed
Sep 19 2003
Issued
Jul 12 2005
Expiry
Jul 12 2019
Assg.orig
Entity
unknown
31
3
n/a
The ornamental design for straight protruding probe beam contour surfaces, as shown and described.

FIG. 1 is a perspective view of an exemplary environmental structure of a probe beam having straight protruding probe beam contour surfaces.

FIG. 2 is a plan view of an exemplary environmental structure of a probe beam in protruding direction of the straight protruding probe beam contour surfaces. Section lines indicate the position of the corresponding cross sections of FIGS. 8, 9, 10 with respect to the exemplary environmental structure of a probe beam. The section line arrows on both ends of each section line indicate the view direction of the corresponding cross section views.

FIG. 3 is a plan view of an exemplary environmental structure of a probe beam in protruding direction of the straight protruding probe beam contour surfaces without section lines.

FIG. 4 is a top view in direction from above with respect to FIG. 3. The solid lines depict the straight protruding probe beam contour surfaces. The dashed lines illustrate the environmental structure of an exemplary buckling beam.

FIG. 5 is a side view in direction from right with respect to FIG. 3. The solid lines depict the straight protruding probe beam contour surfaces. The dashed lines illustrate the environmental structure of an exemplary buckling beam.

FIG. 6 is a bottom view in direction from below with respect to FIG. 3. The solid lines depict the straight protruding probe beam contour surfaces. The dashed lines illustrate the environmental structure of an exemplary buckling beam.

FIG. 7 is a side view in direction from left with respect to FIG. 3. The solid lines depict the straight protruding probe beam contour surfaces. The dashed lines illustrate the environmental structure of an exemplary buckling beam.

FIG. 8 is an enlarged cross section view indicated in FIG. 2 by section line 8—8. The cross hatching indicates the contour with respect to the section line 8—8. The solid lines depict the straight protruding probe beam contour surfaces. The dashed lines illustrate the environmental structure of an exemplary buckling beam.

FIG. 9 is an enlarged cross section view indicated in FIG. 2 by section line 9—9. The cross hatching indicates the contour with respect to the section line 9—9. The solid lines depict the straight protruding probe beam contour surfaces. The dashed lines illustrate the environmental structure of an exemplary buckling beam; and,

FIG. 10 is an enlarged cross section view indicated in FIG. 2 by section line 10—10. The cross hatching indicates the contour with respect to the section line 10—10. The solid lines depict the straight protruding probe beam contour surfaces. The dashed lines illustrate the environmental structure of an exemplary buckling beam.

The broken lines shown in FIGS. 1-10 are for illustrative purposes only and form no part of the claimed design.

Kister, January

Patent Priority Assignee Title
11761982, Dec 31 2019 MICROFABRICA INC Probes with planar unbiased spring elements for electronic component contact and methods for making such probes
11768227, Feb 22 2019 Microfabrica Inc. Multi-layer probes having longitudinal axes and preferential probe bending axes that lie in planes that are nominally parallel to planes of probe layers
11774467, Sep 01 2020 MICROFABRICA INC Method of in situ modulation of structural material properties and/or template shape
11802891, Dec 31 2019 MICROFABRICA INC Compliant pin probes with multiple spring segments and compression spring deflection stabilization structures, methods for making, and methods for using
11867721, Dec 31 2019 MICROFABRICA INC Probes with multiple springs, methods for making, and methods for using
11906549, Dec 31 2019 Microfabrica Inc. Compliant pin probes with flat extension springs, methods for making, and methods for using
7649372, Nov 14 2003 WINWAY TECHNOLOGY CO , LTD Die design with integrated assembly aid
7659739, Sep 14 2006 Micro Porbe, Inc. Knee probe having reduced thickness section for control of scrub motion
7671610, Oct 19 2007 MICROPROBE, INC Vertical guided probe array providing sideways scrub motion
7733101, May 21 2004 MICROPROBE, INC Knee probe having increased scrub motion
7759949, May 21 2004 MICROPROBE, INC Probes with self-cleaning blunt skates for contacting conductive pads
7786740, Oct 11 2006 MICROPROBE, INC Probe cards employing probes having retaining portions for potting in a potting region
7850460, May 09 2008 FEINMETALL GMBH Electrical contact element for contacting an electrical component under test and contacting apparatus
7944224, Dec 07 2005 MICROPROBE, INC Low profile probe having improved mechanical scrub and reduced contact inductance
7952377, Apr 10 2007 MICROPROBE, INC Vertical probe array arranged to provide space transformation
8111080, May 21 2004 MICROPROBE, INC Knee probe having reduced thickness section for control of scrub motion
8203353, Jul 09 2004 MICROPROBE, INC Probes with offset arm and suspension structure
8230593, May 29 2008 MICROPROBE, INC Probe bonding method having improved control of bonding material
8324923, Apr 10 2007 MICROPROBE, INC Vertical probe array arranged to provide space transformation
8415963, Dec 07 2005 MICROPROBE, INC Low profile probe having improved mechanical scrub and reduced contact inductance
8723546, Oct 19 2007 MICROPROBE, INC Vertical guided layered probe
8907689, Oct 11 2006 MICROPROBE, INC Probe retention arrangement
8988091, May 21 2004 MICROPROBE, INC Multiple contact probes
9097740, May 21 2004 MICROPROBE, INC Layered probes with core
9274143, Apr 10 2007 FormFactor, Inc. Vertical probe array arranged to provide space transformation
9310428, Oct 11 2006 FORMFACTOR , INC Probe retention arrangement
9316670, May 21 2004 FormFactor, Inc. Multiple contact probes
9476911, May 21 2004 MICROPROBE, INC Probes with high current carrying capability and laser machining methods
D894025, May 16 2018 Nidec-Read Corporation; SV PROBE TECHNOLOGY TAIWAN CO , LTD Electric characteristic measuring probe
RE43503, Jun 29 2006 MICROPROBE, INC Probe skates for electrical testing of convex pad topologies
RE44407, Mar 20 2006 MICROPROBE, INC Space transformers employing wire bonds for interconnections with fine pitch contacts
Patent Priority Assignee Title
6515496, May 11 2000 TECHNOPROBE S R L Microstructure testing head
6530148, Mar 08 1999 SV Probe Pte Ltd Method for making a probe apparatus for testing integrated circuits
20030057957,
///
Executed onAssignorAssigneeConveyanceFrameReelDoc
Sep 19 2003K&S Interconnect, Inc.(assignment on the face of the patent)
Mar 03 2006KULICKE AND SOFFA INDUSTRIES, INCSV Probe Pte LtdASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0175190082 pdf
Mar 03 2006K&S INTERCONNECT, INC SV Probe Pte LtdASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0175190082 pdf
n/a
Date Maintenance Fee Events


n/a
Date Maintenance Schedule