Patent
   D983681
Priority
Dec 03 2020
Filed
May 28 2021
Issued
Apr 18 2023
Expiry
Apr 18 2038
Assg.orig
Entity
unknown
0
23
n/a
The ornamental design for a probe for testing a device under test, as shown and described.

FIG. 1 is a perspective view of a first embodiment of a probe according to our design;

FIG. 2 is an enlarged, broken away perspective view taken along line A-A on FIG. 1;

FIG. 3 is an enlarged, broken away front view taken along line A-A on FIG. 1;

FIG. 4 is an enlarged, broken away rear view taken along line A-A on FIG. 1;

FIG. 5 is an enlarged left side elevational view of the first embodiment of the probe shown in FIG. 1;

FIG. 6 is an enlarged right side elevational view of the first embodiment of the probe shown in FIG. 1;

FIG. 7 is an enlarged, broken away top plan view taken along line A-A on FIG. 1;

FIG. 8 is an enlarged, broken away bottom plan view taken along line A-A on FIG. 1;

FIG. 9 is another enlarged, broken away perspective view taken along line A-A on FIG. 1;

FIG. 10 is a perspective view of a second embodiment of a probe according to our design;

FIG. 11 is an enlarged, broken away perspective view taken along line B-B on FIG. 10;

FIG. 12 is an enlarged, broken away front view taken along line B-B on FIG. 10;

FIG. 13 is an enlarged, broken away rear view taken along line B-B on FIG. 10;

FIG. 14 is an enlarged left side elevational view of the second embodiment of the probe shown in FIG. 10;

FIG. 15 is an enlarged right side elevational view of the second embodiment of the probe shown in FIG. 10;

FIG. 16 is an enlarged, broken away top plan view taken along line B-B on FIG. 10;

FIG. 17 is an enlarged, broken away bottom plan view taken along line B-B on FIG. 10; and,

FIG. 18 is another enlarged, broken away perspective view taken along line B-B on FIG. 10.

The broken lines depict portions of the probe and form no part of the claimed design. The dash-dot-dash lines depict boundaries between claimed portion and unclaimed portion of the probe and form no part of the claimed design.

Lin, Che-Wei, Chen, Tzu-Yang, Wu, Chen-Rui

Patent Priority Assignee Title
Patent Priority Assignee Title
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D769748, Dec 15 2014 Omron Corporation Probe pin
D769749, Dec 19 2014 Omron Corporation Probe pin
D769751, Dec 15 2014 Omron Corporation Probe pin
D769752, Dec 15 2014 Omron Corporation Probe pin
D769753, Dec 19 2014 Omron Corporation Probe pin
D776551, Dec 15 2014 Omron Corporation Probe pin
D776552, Dec 15 2014 Omron Corporation Probe pin
D787351, Jul 10 2014 FUJIFILM Corporation Probe for photoacoustic measurement device
D787352, Jul 10 2014 FUJIFILM Corporation Probe for photoacoustic measurement device
D788614, Jul 10 2014 FUJIFILM Corporation Probe for photoacoustic measurement device
D788615, Feb 15 2016 Omron Corporation Probe pin
D788616, Feb 15 2016 Omron Corporation Probe pin
D789222, Jul 10 2014 FUJIFILM Corporation Probe for photoacoustic measurement device
D789223, Feb 15 2016 Omron Corporation Probe pin
D789224, Feb 15 2016 Omron Corporation Probe pin
D789225, Feb 15 2016 Omron Corporation Probe pin
D894025, May 16 2018 Nidec-Read Corporation; SV PROBE TECHNOLOGY TAIWAN CO , LTD Electric characteristic measuring probe
D904212, Apr 15 2019 Ingun Prüfmittelbau GmbH Self-cleaning head shape
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Feb 02 2021CHEN, TZU-YANGMPI CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0564150744 pdf
Feb 02 2021LIN, CHE-WEIMPI CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0564150744 pdf
Feb 02 2021WU, CHEN-RUIMPI CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0564150744 pdf
May 28 2021MPI Corporation(assignment on the face of the patent)
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