Patent
   D789224
Priority
Feb 15 2016
Filed
Aug 05 2016
Issued
Jun 13 2017
Expiry
Jun 13 2032
Assg.orig
Entity
unknown
2
7
n/a
The ornamental design for a probe pin, as shown.

FIG. 1 is a front, top, and right side perspective view of a probe pin showing our new design;

FIG. 2 is a front view thereof;

FIG. 3 is a rear view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a top view thereof; and,

FIG. 7 is a bottom view thereof.

Sakai, Takahiro, Teranishi, Hirotada

Patent Priority Assignee Title
D983681, Dec 03 2020 MPI Corporation Probe for testing device under test
ER6991,
Patent Priority Assignee Title
7789671, Jun 16 2008 Hon Hai Precision Ind. Co., Ltd. Electrical contact with overlapping structure
7815440, Aug 11 2008 Hon Hai Precision Ind. Co., Ltd. Electrical contact with interlocking arrangement
8033872, Jan 12 2010 Hon Hai Precision Ind. Co., Ltd. Contact terminal for test socket
8547128, May 06 2012 Contact probe with conductively coupled plungers
8669774, Apr 09 2010 Yamaichi Electronics Co., Ltd.; YAMAICHI ELECTRONICS CO , LTD Probe pin and an IC socket with the same
8715015, May 11 2011 HICON CO , LTD ; HWANG, DONG WEON Structure for a spring contact
8808038, Nov 11 2009 HICON CO , LTD ; HWANG, DONG WEON Spring contact and a socket embedded with spring contacts
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Jul 27 2016SAKAI, TAKAHIROOmron CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0394250141 pdf
Aug 04 2016TERANISHI, HIROTADAOmron CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0394250141 pdf
Aug 05 2016Omron Corporation(assignment on the face of the patent)
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