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Patent
D789224
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Priority
Feb 15 2016
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Filed
Aug 05 2016
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Issued
Jun 13 2017
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Expiry
Jun 13 2032
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Assg.orig
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Entity
unknown
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2
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7
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n/a
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The ornamental design for a probe pin, as shown.
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FIG. 1 is a front, top, and right side perspective view of a probe pin showing our new design;
FIG. 2 is a front view thereof;
FIG. 3 is a rear view thereof;
FIG. 4 is a left side view thereof;
FIG. 5 is a right side view thereof;
FIG. 6 is a top view thereof; and,
FIG. 7 is a bottom view thereof.
Sakai, Takahiro, Teranishi, Hirotada
Patent |
Priority |
Assignee |
Title |
7789671, |
Jun 16 2008 |
Hon Hai Precision Ind. Co., Ltd. |
Electrical contact with overlapping structure |
7815440, |
Aug 11 2008 |
Hon Hai Precision Ind. Co., Ltd. |
Electrical contact with interlocking arrangement |
8033872, |
Jan 12 2010 |
Hon Hai Precision Ind. Co., Ltd. |
Contact terminal for test socket |
8547128, |
May 06 2012 |
|
Contact probe with conductively coupled plungers |
8669774, |
Apr 09 2010 |
Yamaichi Electronics Co., Ltd.; YAMAICHI ELECTRONICS CO , LTD |
Probe pin and an IC socket with the same |
8715015, |
May 11 2011 |
HICON CO , LTD ; HWANG, DONG WEON |
Structure for a spring contact |
8808038, |
Nov 11 2009 |
HICON CO , LTD ; HWANG, DONG WEON |
Spring contact and a socket embedded with spring contacts |
Date |
Maintenance Fee Events |
n/a
Date |
Maintenance Schedule |
n/a