Patent
   D789225
Priority
Feb 15 2016
Filed
Aug 05 2016
Issued
Jun 13 2017
Expiry
Jun 13 2032
Assg.orig
Entity
unknown
1
4
n/a
The ornamental design for a probe pin, as shown.

FIG. 1 is a front, top, and right side perspective view of a probe pin showing our new design;

FIG. 2 is a front view thereof;

FIG. 3 is a rear view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a top view thereof; and,

FIG. 7 is a bottom view thereof.

Sakai, Takahiro, Teranishi, Hirotada

Patent Priority Assignee Title
D983681, Dec 03 2020 MPI Corporation Probe for testing device under test
Patent Priority Assignee Title
8715015, May 11 2011 HICON CO , LTD ; HWANG, DONG WEON Structure for a spring contact
9124012, Oct 14 2011 Omron Corporation Bellows body contactor having a fixed touch piece
9130290, Oct 14 2011 Omron Corporation Bellows body contactor having a fixed touch piece
9322846, Oct 14 2011 Omron Corporation Contactor
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Jul 27 2016SAKAI, TAKAHIROOmron CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0394240072 pdf
Aug 04 2016TERANISHI, HIROTADAOmron CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0394240072 pdf
Aug 05 2016Omron Corporation(assignment on the face of the patent)
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