Patent
   D769751
Priority
Dec 15 2014
Filed
Jun 15 2015
Issued
Oct 25 2016
Expiry
Oct 25 2031
Assg.orig
Entity
unknown
5
16
n/a
The ornamental design for a probe pin, as shown and described.

FIG. 1 is a perspective view of a probe pin;

FIG. 2 is a front elevation view thereof;

FIG. 3 is a rear elevation view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

The broken lines depict the environmental subject matter only and form no part of the claimed design. The dot-dash line represents the boundary of the claimed design.

Sakai, Takahiro, Teranishi, Hirotada

Patent Priority Assignee Title
D942290, Jul 12 2019 Johnstech International Corporation Tip for integrated circuit test pin
D983681, Dec 03 2020 MPI Corporation Probe for testing device under test
ER6991,
ER7328,
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Jun 11 2015TERANISHI, HIROTADAOmron CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0392350769 pdf
Jun 11 2015SAKAI, TAKAHIROOmron CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0392350769 pdf
Jun 15 2015Omron Corporation(assignment on the face of the patent)
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