Patent
   D769749
Priority
Dec 19 2014
Filed
Jun 16 2015
Issued
Oct 25 2016
Expiry
Oct 25 2031
Assg.orig
Entity
unknown
16
15
n/a
The ornamental design for a probe pin, as shown and described.

FIG. 1 is a perspective view of a probe pin;

FIG. 2 is a front elevation view thereof

FIG. 3 is a rear elevation view thereof

FIG. 4 is a left side view thereof

FIG. 5 is a right side view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

Sakai, Takahiro, Teranishi, Hirotada

Patent Priority Assignee Title
D855569, May 27 2014 Vishay Dale Electronics, LLC Edge-wound resistor
D867183, Feb 10 2017 Kabushiki Kaisha Nihon Micronics Probe pin
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D894025, May 16 2018 Nidec-Read Corporation; SV PROBE TECHNOLOGY TAIWAN CO , LTD Electric characteristic measuring probe
D942290, Jul 12 2019 Johnstech International Corporation Tip for integrated circuit test pin
D983681, Dec 03 2020 MPI Corporation Probe for testing device under test
ER18,
ER6991,
Patent Priority Assignee Title
8366496, Mar 18 2010 Hon Hai Precision Ind. Co., Ltd. Composite contact assembly having lower contact with contact engaging points offset from each other
8460010, Sep 28 2009 Kabushiki Kaisha Nihon Micronics Contact and electrical connecting apparatus
8669774, Apr 09 2010 Yamaichi Electronics Co., Ltd.; YAMAICHI ELECTRONICS CO , LTD Probe pin and an IC socket with the same
8808038, Nov 11 2009 HICON CO , LTD ; HWANG, DONG WEON Spring contact and a socket embedded with spring contacts
9130290, Oct 14 2011 Omron Corporation Bellows body contactor having a fixed touch piece
9322846, Oct 14 2011 Omron Corporation Contactor
229184,
D507197, Nov 22 2004 Measure tape
D662895, Jan 27 2010 Kabushiki Kaisha Nihon Micronics Electric contact
D665744, Sep 28 2010 Adamant Kogyo Co., Ltd. Optical fiber connector
D665745, Sep 28 2010 Adamant Kogyo Co., Ltd. Optical fiber connector
D749968, Jan 24 2014 Fluke Precision Measurement LTD Electrical test lead
D750987, Jan 24 2014 Fluke Precision Measurement LTD Interactive test probe for battery tester
JP2011232181,
TW157152,
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Jun 11 2015TERANISHI, HIROTADAOmron CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0391950726 pdf
Jun 11 2015SAKAI, TAKAHIROOmron CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0391950726 pdf
Jun 16 2015Omron Corporation(assignment on the face of the patent)
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