Patent
   D873686
Priority
Feb 02 2018
Filed
Aug 01 2018
Issued
Jan 28 2020
Expiry
Jan 28 2035
Assg.orig
Entity
unknown
0
22
n/a
The ornamental design for an electric contact, as shown and described.

FIG. 1 is a perspective view of a portion of an electric contact, showing the claimed design;

FIG. 2 is a front elevation view of the electric contact;

FIG. 3 is a rear elevation view of the electric contact;

FIG. 4 is a left side elevation view of the electric contact;

FIG. 5 is a right side elevation view of the electric contact;

FIG. 6 is a top plan view of the electric contact;

FIG. 7 is a bottom plan view of the electric contact;

FIG. 8 is an enlarged view of the section of the electric contact as indicated in FIG. 2;

FIG. 9 is an enlarged left side view of the section of the electric contact as indicated in FIG. 2;

FIG. 10 is an enlarged right side view of the section of the electric contact as indicated in FIG. 2;

FIG. 11 is a sectional view of the electric contact taken along line 11-11 in FIG. 8; and,

FIG. 12 is a sectional view of the electric contact taken along line 12-12 in FIG. 8.

The broken lines shown in the figures are only for the purpose of illustrating the unclaimed portions of the article, and form no part of the claimed design. Chain or line-dot broken lines indicate boundary lines between the claimed portions and the unclaimed portions, and are for illustration only and form no part of the claimed design.

Otsuka, Yoshihiko, Nasu, Mika, Fukatsu, Namiko

Patent Priority Assignee Title
Patent Priority Assignee Title
10241133, Dec 31 2014 Tektronix, Inc Probe tip and probe assembly
4634968, Dec 20 1982 L-3 Communications Corporation Wide range radiation monitor
4716365, Oct 11 1985 Lisle Corporation Circuit tester
4740746, Nov 13 1984 Tektronix, Inc. Controlled impedance microcircuit probe
5172051, Apr 24 1991 Agilent Technologies Inc Wide bandwidth passive probe
7208971, Oct 15 2002 General Electric Company Manual probe carriage system and method of using the same
8283939, Apr 01 2010 Hon Hai Precision Industry Co., Ltd. Test probe
9046568, Mar 27 2009 ESSAI, INC Universal spring contact pin and IC test socket therefor
9547023, Jul 02 2010 ISC CO , LTD Test probe for test and fabrication method thereof
9810715, Dec 31 2014 Tektronix, Inc High impedance compliant probe tip
20110050261,
20130069669,
20150070040,
20150369859,
20170138985,
D311346, Sep 25 1987 Q.A. Technology Company Electronic test probe
D397052, Apr 08 1997 Societe Chauvin Arnoux Test lead
D686098, Nov 14 2012 AGAR CORPORATION Ltd. Antenna detection probe for a storage tank
D769748, Dec 15 2014 Omron Corporation Probe pin
D769749, Dec 19 2014 Omron Corporation Probe pin
D776551, Dec 15 2014 Omron Corporation Probe pin
D776552, Dec 15 2014 Omron Corporation Probe pin
////
Executed onAssignorAssigneeConveyanceFrameReelDoc
Jul 06 2018NASU, MIKAKabushiki Kaisha Nihon MicronicsASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0469440036 pdf
Jul 09 2018OTSUKA, YOSHIHIKOKabushiki Kaisha Nihon MicronicsASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0469440036 pdf
Jul 09 2018FUKATSU, NAMIKOKabushiki Kaisha Nihon MicronicsASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0469440036 pdf
Aug 01 2018Kabushiki Kaisha Nihon Micronics(assignment on the face of the patent)
n/a
Date Maintenance Fee Events


n/a
Date Maintenance Schedule