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The ornamental design for a test lead, as shown. |
FIG. 1 is a perspective view of the test lead according to our new design;
FIG. 2 is a side elevational view thereof;
FIG. 3 is a top plan view thereof;
FIG. 4 is a bottom plan view thereof;
FIG. 5 is an enlarged end view thereof, as seen from the left side of FIG. 2;
FIG. 6 is an enlarged end view thereof, as seen from the right side of FIG. 2;
FIG. 7 is an exploded view of the tip end of FIG. 4, showing the inner construction of the tip; and,
FIG. 8 is a perspective view of another embodiment of the test lead of our new design, the modifications appearing at the connector and tip.
Arnoux, Daniel, Genter, Claude, Arnoux, Axel
Patent | Priority | Assignee | Title |
D867183, | Feb 10 2017 | Kabushiki Kaisha Nihon Micronics | Probe pin |
D869305, | Feb 10 2017 | Kabushiki Kaisha Nihon Micronics | Probe pin |
D873159, | Feb 02 2018 | Kabushiki Kaisha Nihon Micronics | Electric contact |
D873160, | Feb 02 2018 | Kabushiki Kaisha Nihon Micronics | Electric contact |
D873161, | Feb 02 2018 | Kabushiki Kaisha Nihon Micronics | Electric contact |
D873683, | Feb 02 2018 | Kabushiki Kaisha Nihon Micronics | Electric contact |
D873684, | Feb 02 2018 | Kabushiki Kaisha Nihon Micronics | Electric contact |
D873685, | Feb 02 2018 | Kabushiki Kaisha Nihon Micronics | Electric contact |
D873686, | Feb 02 2018 | Kabushiki Kaisha Nihon Micronics | Electric contact |
D874958, | Feb 02 2018 | Kabushiki Kaisha Nihon Micronics | Electric contact |
Patent | Priority | Assignee | Title |
D334147, | Jun 13 1990 | Tektronix, Inc.; TEKRONIX, INC | Electrical test probe |
D344681, | Jun 13 1990 | Tektronix, Inc. | Head assembly for a switchable electrical test probe |
Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
Mar 14 1997 | ARNOUX, DANIEL | Societe Chauvin Arnoux | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 008592 | /0323 | |
Mar 14 1997 | ARNOUX, AXEL | Societe Chauvin Arnoux | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 008592 | /0323 | |
Mar 14 1997 | GENTER, CLAUDE | Societe Chauvin Arnoux | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 008592 | /0323 | |
Apr 08 1997 | Societe Chauvin Arnoux | (assignment on the face of the patent) | / |
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