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The ornamental design for an electrical test probe, as shown. |
FIG. 1 is a perspective view of an electrical test probe showing our new design;
FIG. 2 is a left side elevational view thereof, the right side elevational view being a mirror image;
FIG. 3 is a top plan view thereof;
FIG. 4 is a bottom plan view thereof;
FIG. 5 is a front elevational view thereof; and,
FIG. 6 is a rear elevational view thereof.
Aukstikalnis, Glen, Nightingale, Mark
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Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
Jun 13 1990 | Tektronix, Inc. | (assignment on the face of the patent) | / | |||
Jun 13 1990 | AUKSTIKALNIS, GLEN | TEKRONIX, INC | ASSIGNMENT OF ASSIGNORS INTEREST | 006355 | /0890 | |
Jun 13 1990 | NIGHTINGALE, MARK | TEKRONIX, INC | ASSIGNMENT OF ASSIGNORS INTEREST | 006355 | /0890 |
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