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Patent
D311346
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Priority
Sep 25 1987
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Filed
Sep 25 1987
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Issued
Oct 16 1990
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Expiry
Oct 16 2004
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Assg.orig
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Entity
unknown
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12
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5
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n/a
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The ornamental design for electronic test probe, as shown and described.
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FIG. 1 is a front perspective view of a electronic test probe showing my
new design;
FIG. 2 is a rear elevational view, taken along line 2--2 of FIG. 1; and
FIG. 3 is a front end elevational view thereof, taken along line 3--3 of
FIG. 3.
Gross, Robert F.
Patent |
Priority |
Assignee |
Title |
D333629, |
Dec 02 1991 |
PEPPERL + FUCHS GMBH, LTD ; HONEYWELL INTELLECTUAL PROPERTIES INC |
Photoelectric sensor housing |
D334147, |
Jun 13 1990 |
Tektronix, Inc.; TEKRONIX, INC |
Electrical test probe |
D340658, |
Mar 05 1992 |
VALMET AUTOMATION OY |
Rod sensor |
D344903, |
Nov 25 1992 |
ALCON MANUFACTURING, LTD |
Bipolar probe |
D873159, |
Feb 02 2018 |
Kabushiki Kaisha Nihon Micronics |
Electric contact |
D873160, |
Feb 02 2018 |
Kabushiki Kaisha Nihon Micronics |
Electric contact |
D873161, |
Feb 02 2018 |
Kabushiki Kaisha Nihon Micronics |
Electric contact |
D873683, |
Feb 02 2018 |
Kabushiki Kaisha Nihon Micronics |
Electric contact |
D873684, |
Feb 02 2018 |
Kabushiki Kaisha Nihon Micronics |
Electric contact |
D873685, |
Feb 02 2018 |
Kabushiki Kaisha Nihon Micronics |
Electric contact |
D873686, |
Feb 02 2018 |
Kabushiki Kaisha Nihon Micronics |
Electric contact |
D874958, |
Feb 02 2018 |
Kabushiki Kaisha Nihon Micronics |
Electric contact |
Date |
Maintenance Fee Events |
n/a
Date |
Maintenance Schedule |
n/a