Patent
   D311346
Priority
Sep 25 1987
Filed
Sep 25 1987
Issued
Oct 16 1990
Expiry
Oct 16 2004
Assg.orig
Entity
unknown
12
5
n/a
The ornamental design for electronic test probe, as shown and described.

FIG. 1 is a front perspective view of a electronic test probe showing my new design;

FIG. 2 is a rear elevational view, taken along line 2--2 of FIG. 1; and

FIG. 3 is a front end elevational view thereof, taken along line 3--3 of FIG. 3.

Gross, Robert F.

Patent Priority Assignee Title
D333629, Dec 02 1991 PEPPERL + FUCHS GMBH, LTD ; HONEYWELL INTELLECTUAL PROPERTIES INC Photoelectric sensor housing
D334147, Jun 13 1990 Tektronix, Inc.; TEKRONIX, INC Electrical test probe
D340658, Mar 05 1992 VALMET AUTOMATION OY Rod sensor
D344903, Nov 25 1992 ALCON MANUFACTURING, LTD Bipolar probe
D873159, Feb 02 2018 Kabushiki Kaisha Nihon Micronics Electric contact
D873160, Feb 02 2018 Kabushiki Kaisha Nihon Micronics Electric contact
D873161, Feb 02 2018 Kabushiki Kaisha Nihon Micronics Electric contact
D873683, Feb 02 2018 Kabushiki Kaisha Nihon Micronics Electric contact
D873684, Feb 02 2018 Kabushiki Kaisha Nihon Micronics Electric contact
D873685, Feb 02 2018 Kabushiki Kaisha Nihon Micronics Electric contact
D873686, Feb 02 2018 Kabushiki Kaisha Nihon Micronics Electric contact
D874958, Feb 02 2018 Kabushiki Kaisha Nihon Micronics Electric contact
Patent Priority Assignee Title
4397519, May 12 1981 Delaware Capital Formation, Inc Electrical contact construction
4461993, Sep 21 1981 Everett/Charles, Inc. Low resistance electrical spring probe
4597622, Mar 25 1985 QA Technology Company Electrical connector for electrical circuit test probe and connector
4659987, Mar 25 1985 QA Technology Company Electrical circuit test probe and connector
DE3103077,
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Sep 24 1987GROSS, ROBERT F QA TECHNOLOGY COMPANY, 48 PORTSMOUTH AVENUE EXETER, NEW HAMPSHIRE 03833ASSIGNMENT OF ASSIGNORS INTEREST 0047930330 pdf
Sep 25 1987Q.A. Technology Company(assignment on the face of the patent)
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