Patent
   D867183
Priority
Feb 10 2017
Filed
Jul 28 2017
Issued
Nov 19 2019
Expiry
Nov 19 2034
Assg.orig
Entity
unknown
0
13
n/a
The ornamental design for a probe pin, as shown and described.

FIG. 1 is a perspective view of a portion of a probe pin, showing the claimed design;

FIG. 2 is a front view of the probe pin;

FIG. 3 is a rear view of the probe pin;

FIG. 4 is a left side view of the probe pin;

FIG. 5 is a right side view of the probe pin;

FIG. 6 is a top plan view of the probe pin;

FIG. 7 is a bottom plan view of the probe pin;

FIG. 8 is an enlarged view of the section of the probe pin identified by the reference Nos. 8-8 in FIG. 2; and,

FIG. 9 is an enlarged left side view of the probe pin.

The broken lines shown in the figures represent portions of the probe pin that form no part of the claimed design. The line-dot broken lines indicate boundary lines between the claimed portions and the disclaimed portions, and are for illustration only and form no part of the claimed design.

Nasu, Mika

Patent Priority Assignee Title
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D769748, Dec 15 2014 Omron Corporation Probe pin
D769749, Dec 19 2014 Omron Corporation Probe pin
D776551, Dec 15 2014 Omron Corporation Probe pin
D776552, Dec 15 2014 Omron Corporation Probe pin
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KR20160063284,
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Jul 20 2017NASU, MIKAKabushiki Kaisha Nihon MicronicsASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0431610659 pdf
Jul 20 2017NASU, MIKAKabushiki Kaisha Nihon MicronicsCORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE ADDRESS PREVIOUSLY RECORDED AT REEL: 043161 FRAME: 0659 ASSIGNOR S HEREBY CONFIRMS THE ASSIGNMENT 0441150337 pdf
Jul 28 2017Kabushiki Kaisha Nihon Micronics(assignment on the face of the patent)
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