Patent
   D788615
Priority
Feb 15 2016
Filed
Aug 05 2016
Issued
Jun 06 2017
Expiry
Jun 06 2032
Assg.orig
Entity
unknown
3
4
n/a
The ornamental design for a probe pin, as shown and described.

FIG. 1 is a front, top, and right side perspective view of a probe pin showing our new design;

FIG. 2 is a front view thereof;

FIG. 3 is a rear view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a top view thereof;

FIG. 7 is a bottom view thereof; and,

FIG. 8 is an exploded perspective view thereof.

The even broken lines shown in the figures illustrate portions of the probe pin that form no part of the claimed design. The uneven broken lines shown in the figures represent unclaimed boundaries.

Sakai, Takahiro, Teranishi, Hirotada

Patent Priority Assignee Title
D942290, Jul 12 2019 Johnstech International Corporation Tip for integrated circuit test pin
D983681, Dec 03 2020 MPI Corporation Probe for testing device under test
ER6991,
Patent Priority Assignee Title
8715015, May 11 2011 HICON CO , LTD ; HWANG, DONG WEON Structure for a spring contact
9124012, Oct 14 2011 Omron Corporation Bellows body contactor having a fixed touch piece
9130290, Oct 14 2011 Omron Corporation Bellows body contactor having a fixed touch piece
9322846, Oct 14 2011 Omron Corporation Contactor
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Jul 27 2016SAKAI, TAKAHIROOmron CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0394230333 pdf
Aug 04 2016TERANISHI, HIROTADAOmron CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0394230333 pdf
Aug 05 2016Omron Corporation(assignment on the face of the patent)
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