|
The ornamental design for a continuously profiled probe beam, as shown and described.
|
|||||||||||||||||
FIG. 1 shows the continuously profiled probe beam in profile direction.
FIG. 2 is a top view.
FIG. 3 is a side view.
FIG. 4 is an enlarged cross section view indicated in FIG. 1 by section line 4—4.
FIG. 5 is an enlarged cross section view indicated in FIG. 1 by section line 5—5; and,
FIG. 6 is an enlarged cross section view indicated in FIG. 1 by section line 6—6.
| Patent | Priority | Assignee | Title |
| 7649372, | Nov 14 2003 | WINWAY TECHNOLOGY CO , LTD | Die design with integrated assembly aid |
| 7659739, | Sep 14 2006 | Micro Porbe, Inc. | Knee probe having reduced thickness section for control of scrub motion |
| 7671610, | Oct 19 2007 | MICROPROBE, INC | Vertical guided probe array providing sideways scrub motion |
| 7733101, | May 21 2004 | MICROPROBE, INC | Knee probe having increased scrub motion |
| 7759949, | May 21 2004 | MICROPROBE, INC | Probes with self-cleaning blunt skates for contacting conductive pads |
| 7786740, | Oct 11 2006 | MICROPROBE, INC | Probe cards employing probes having retaining portions for potting in a potting region |
| 7944224, | Dec 07 2005 | MICROPROBE, INC | Low profile probe having improved mechanical scrub and reduced contact inductance |
| 7952377, | Apr 10 2007 | MICROPROBE, INC | Vertical probe array arranged to provide space transformation |
| 8111080, | May 21 2004 | MICROPROBE, INC | Knee probe having reduced thickness section for control of scrub motion |
| 8203353, | Jul 09 2004 | MICROPROBE, INC | Probes with offset arm and suspension structure |
| 8230593, | May 29 2008 | MICROPROBE, INC | Probe bonding method having improved control of bonding material |
| 8324923, | Apr 10 2007 | MICROPROBE, INC | Vertical probe array arranged to provide space transformation |
| 8415963, | Dec 07 2005 | MICROPROBE, INC | Low profile probe having improved mechanical scrub and reduced contact inductance |
| 8723546, | Oct 19 2007 | MICROPROBE, INC | Vertical guided layered probe |
| 8907689, | Oct 11 2006 | MICROPROBE, INC | Probe retention arrangement |
| 8988091, | May 21 2004 | MICROPROBE, INC | Multiple contact probes |
| 9097740, | May 21 2004 | MICROPROBE, INC | Layered probes with core |
| 9274143, | Apr 10 2007 | FormFactor, Inc. | Vertical probe array arranged to provide space transformation |
| 9310428, | Oct 11 2006 | FORMFACTOR , INC | Probe retention arrangement |
| 9316670, | May 21 2004 | FormFactor, Inc. | Multiple contact probes |
| 9476911, | May 21 2004 | MICROPROBE, INC | Probes with high current carrying capability and laser machining methods |
| D520887, | Apr 16 2004 | MIRCOSULIS LIMITED | Probe |
| D894025, | May 16 2018 | Nidec-Read Corporation; SV PROBE TECHNOLOGY TAIWAN CO , LTD | Electric characteristic measuring probe |
| RE43503, | Jun 29 2006 | MICROPROBE, INC | Probe skates for electrical testing of convex pad topologies |
| RE44407, | Mar 20 2006 | MICROPROBE, INC | Space transformers employing wire bonds for interconnections with fine pitch contacts |
| Patent | Priority | Assignee | Title |
| 6515496, | May 11 2000 | TECHNOPROBE S R L | Microstructure testing head |
| 6530148, | Mar 08 1999 | SV Probe Pte Ltd | Method for making a probe apparatus for testing integrated circuits |
| Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
| Jun 11 2003 | K&S Interconnect, Inc. | (assignment on the face of the patent) | / | |||
| Sep 03 2003 | KISTER, JANUARY | KULICKE & SOFFIA INTERCONNECT, INC | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 014478 | /0606 | |
| Sep 03 2003 | KISTER, JANUARY | K&S INTERCONNECT, INC | REQUEST FOR CORRECTED NOTICE OF RECORDATON OF ASSIGNMENT DOCUMENT CORRECTING ASSIGNEE S NAME REEL FRAME 014478 0606 | 016152 | /0398 | |
| Mar 03 2006 | KULICKE AND SOFFA INDUSTRIES, INC | SV Probe Pte Ltd | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 017519 | /0082 | |
| Mar 03 2006 | K&S INTERCONNECT, INC | SV Probe Pte Ltd | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 017519 | /0082 |
| Date | Maintenance Fee Events |
| Date | Maintenance Schedule |