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The ornamental design for a probe pin, as shown and described.
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The broken lines shown in the figures represent portions of the probe pin that form no part of the claimed design. The line-dot broken lines indicate boundary lines between the claimed portions and the disclaimed portions, and are for illustration only and form no part of the claimed design.
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Aug 30 2017 | Kabushiki Kaisha Nihon Micronics | (assignment on the face of the patent) | / |
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