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Patent
   D850309
Priority
Jul 27 2017
Filed
Jul 27 2017
Issued
Jun 04 2019
Expiry
Jun 04 2034
Inventors
Jovanovic,…
Assg.orig
AEHR TEST …
Assg.curr
AEHR TEST …
Entity
unknown
Referenced by
4
References
1
Maint.:
n/a
The ornamental design of a layout of contacts, as shown and described.

FIG. 1 is a top plan view of a layout of contacts according to our design; and,

FIG. 2 is a side elevation view of the layout of contacts of our design.
INVENTORS:

Jovanovic, Jovan, Steps, Steven C., Lindsey, Scott E., Hendrickson, David S.

THIS PATENT IS REFERENCED BY THESE PATENTS:
Patent Priority Assignee Title
D934820, Oct 24 2019 NUVOTON TECHNOLOGY CORPORATION JAPAN Semiconductor device
D937232, Oct 24 2019 NUVOTON TECHNOLOGY CORPORATION JAPAN Semiconductor device
D937233, Oct 24 2019 NUVOTON TECHNOLOGY CORPORATION JAPAN Semiconductor device
D938925, Oct 24 2019 NUVOTON TECHNOLOGY CORPORATION JAPAN Semiconductor device
THIS PATENT REFERENCES THESE PATENTS:
Patent Priority Assignee Title
D810706, Dec 24 2014 FUJI ELECTRIC CO., LTD Semiconductor module
ASSIGNMENT RECORDS    Assignment records on the USPTO
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Jul 26 2017JOVANOVIC, JOVANAEHR TEST SYSTEMSASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0431210821 pdf
Jul 26 2017LINDSEY, SCOTT E AEHR TEST SYSTEMSASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0431210821 pdf
Jul 26 2017STEPS, STEVEN C AEHR TEST SYSTEMSASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0431210821 pdf
Jul 26 2017HENDRICKSON, DAVID S AEHR TEST SYSTEMSASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0431210821 pdf
Jul 27 2017AEHR TEST SYSTEMS(assignment on the face of the patent)
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