Patent
   D958215
Priority
Jan 29 2019
Filed
Jul 24 2019
Issued
Jul 19 2022
Expiry
Jul 19 2037
Assg.orig
Entity
unknown
0
13
n/a
The ornamental design for an electron microscope, as shown and described.

FIG. 1 is a front, top and right side perspective view of an electron microscope according to the design;

FIG. 2 is a front view thereof;

FIG. 3 is a right side view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a rear view thereof;

FIG. 6 is a top plan view thereof;

FIG. 7 is a bottom plan view thereof;

FIG. 8 is an enlarged view of the portion shown in BOX 8 in FIG. 1;

FIG. 9 is cross-sectional view taken along line 9-9 of FIG. 2; and,

FIG. 10 is an enlarged view of the portion shown in BOX 10 in FIG. 9.

The dashed broken lines in the drawings show portions of the electron microscope that form no part of the claimed design. The dot-dash broken lines in the drawings indicate boundaries of the claimed subject matter that form no part of the claimed design. The dot-dot-dash broken lines in the drawings indicate boundaries of the view indicators that form no part of the claimed design.

Yamamoto, Takashi, Kojima, Akira, Masuda, Ai, Hirato, Tatsuya, Hokari, Junpei, Chinone, Noriyasu

Patent Priority Assignee Title
Patent Priority Assignee Title
D591864, Dec 10 2007 Agilent Technologies, Inc Housing for a biological sample processing apparatus
D636005, Jan 08 2010 Hitachi High-Technologies Corporation Electron microscope
D657407, Dec 15 2009 PHC HOLDINGS CORPORATION Microscope
D715843, Feb 22 2013 Shimadzu Corporation Mass microscope
D723079, Aug 06 2013 Carl Zeiss Meditec AG Operating microscope
D750989, Jul 01 2014 Shimadzu Corporation Chromatography apparatus
D766762, Apr 28 2015 Shimadzu Corporation Mass spectrometry
D841069, Feb 02 2016 Shimadzu Corporation Infrared microscope
D872789, Sep 19 2017 GRUNDIUM OY Imaging device
D886653, Aug 31 2018 Shimadzu Corporation Sample characteristic measuring machine
D887295, May 31 2018 Micromass UK Limited Mass spectrometer
D895462, Aug 31 2018 Shimadzu Corporation Detector for chromatographic analysis
D933730, Feb 18 2020 Shimadzu Corporation Mass microscope
////////
Executed onAssignorAssigneeConveyanceFrameReelDoc
Jul 24 2019HITACHI HIGH-TECH CORPORATION(assignment on the face of the patent)
Sep 26 2019KOJIMA, AKIRAHitachi High-Technologies CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0508430438 pdf
Sep 26 2019HOKARI, JUNPEIHitachi High-Technologies CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0508430438 pdf
Sep 26 2019MASUDA, AIHitachi High-Technologies CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0508430438 pdf
Sep 26 2019YAMAMOTO, TAKASHIHitachi High-Technologies CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0508430438 pdf
Oct 07 2019HIRATO, TATSUYAHitachi High-Technologies CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0508430438 pdf
Oct 07 2019CHINONE, NORIYASUHitachi High-Technologies CorporationASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS 0508430438 pdf
Feb 12 2020Hitachi High-Technologies CorporationHITACHI HIGH-TECH CORPORATIONCHANGE OF NAME SEE DOCUMENT FOR DETAILS 0523980249 pdf
n/a
Date Maintenance Fee Events


n/a
Date Maintenance Schedule