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Patent
D636005
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Priority
Jan 08 2010
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Filed
Jun 09 2010
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Issued
Apr 12 2011
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Expiry
Apr 12 2025
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Assg.orig
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Entity
unknown
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11
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16
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n/a
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We claim the ornamental design for an electron microscope, as shown and described.
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FIG. 1 is a front, top and right side perspective view of an electron microscope showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a top plan view thereof;
FIG. 5 is a bottom plan view thereof;
FIG. 6 is a left side elevational view thereof; and,
FIG. 7 is a right side elevational view thereof.
The broken lines shown are for illustrative purpose and form no part of the claimed design.
Oonuma, Mitsuru, Omachi, Akira, Taniguchi, Yoshifumi, Nagaoki, Isao, Aoyagi, Hiroshi
Patent |
Priority |
Assignee |
Title |
D644258, |
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Nov 30 2012 |
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D715843, |
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Shimadzu Corporation |
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D958215, |
Jan 29 2019 |
HITACHI HIGH-TECH CORPORATION |
Electron microscope |
Patent |
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Assignee |
Title |
2424791, |
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5350921, |
Jul 29 1992 |
Hitachi, Ltd. |
Analytical electron microscope and a method of operating such an electron microscope |
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Olympus Optical Co., Ltd. |
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Hitachi, Ltd. |
Electronic microscope |
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Jul 03 1995 |
Hitachi, Ltd. |
Electron microscope |
D571385, |
Jun 19 2006 |
Hitachi High-Technologies Corporation |
Electron microscope |
D608810, |
Jul 15 2008 |
NT-MDT SERVICE & LOGISTICS LTD |
Microscope |
D623211, |
Mar 19 2009 |
HITACHI HIGH-TECH CORPORATION |
Electron microscope |
D625749, |
Mar 19 2009 |
HITACHI HIGH-TECH CORPORATION |
Electron microscope |
D626579, |
Sep 30 2009 |
HITACHI HIGH-TECH CORPORATION |
Electron microscope |
Date |
Maintenance Fee Events |
n/a
Date |
Maintenance Schedule |
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