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The ornamental design for an electron microscope, as shown and described. |
FIG. 1 is a front, top and right side perspective view of an Electron Microscope showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a top plan view thereof;
FIG. 4 is a bottom plan view thereof;
FIG. 5 is a right side view therof;
FIG. 6 is a left side view therof;
FIG. 7 is a rear elevational view thereof; and,
FIG. 8 is a front, top and right side perspective view of an Electron Microscope in condition of usage, it being understood that the broken line showing of environment is for illustrative purposes only and forms no part of the claimed design.
Terakado, Sadao, Kobayashi, Hiroyuki, Hohmann, Peter, Miyata, Tomoyuki, Sato, Hisashi, Katayama, Atsushi, Tsuboi, Daiji
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Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
Jun 26 1995 | MIYATA, TOMOYUKI | Hitachi, LTD | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 008632 | /0312 | |
Jun 26 1995 | KATAYAMA, ATSUSHI | Hitachi, LTD | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 008632 | /0312 | |
Jun 26 1995 | TSUBOI, DAIJI | Hitachi, LTD | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 008632 | /0312 | |
Jun 26 1995 | KOBAYASHI, HIROYUKI | Hitachi, LTD | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 008632 | /0312 | |
Jun 26 1995 | SATO, HISASHI | Hitachi, LTD | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 008632 | /0312 | |
Jun 26 1995 | TERAKADO, SADAO | Hitachi, LTD | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 008632 | /0312 | |
Jun 26 1995 | HOHMANN, PETER | Hitachi, LTD | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 008632 | /0312 | |
Jul 27 1995 | Hitachi, Ltd. | (assignment on the face of the patent) | / |
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