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Patent
D851151
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Priority
Jul 25 2017
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Filed
Jan 24 2018
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Issued
Jun 11 2019
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Expiry
Jun 11 2034
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Assg.orig
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Entity
unknown
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2
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12
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n/a
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The ornamental design for a microscope, as shown and described.
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FIG. 1 is a front, top and right side perspective view of a microscope according to the design;
FIG. 2 is a front, top and left side perspective view thereof;
FIG. 3 is a rear, top and left side perspective view thereof;
FIG. 4 is a front elevational view thereof;
FIG. 5 is a rear elevational view thereof;
FIG. 6 is a right side elevational view thereof;
FIG. 7 is a left side elevational view thereof;
FIG. 8 is a top plan view thereof; and,
FIG. 9 is a bottom plan view thereof.
Suzuki, Hiroyuki, Noda, Hiroyuki, Masuda, Ai, Otsuka, Yasutaka
Patent |
Priority |
Assignee |
Title |
3835320, |
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|
|
5946131, |
Jul 16 1996 |
Perkin-Elmer Ltd. |
Microscope aperture control |
173282, |
|
|
|
229581, |
|
|
|
D303267, |
Aug 07 1986 |
Olympus Optical Co., Ltd. |
Ultrasonic microscope |
D381031, |
Jul 03 1995 |
Hitachi, Ltd. |
Electron microscope |
D638046, |
Feb 22 2010 |
HITACHI HIGH-TECH CORPORATION |
Electron microscope |
D644258, |
Feb 22 2010 |
HITACHI HIGH-TECH CORPORATION |
Electron microscope |
D679026, |
Feb 20 2009 |
SII Nano Technology Inc. |
Compound charged particle beam device |
D687475, |
May 10 2012 |
HITACHI HIGH-TECH CORPORATION |
Electron microscope |
D693866, |
Sep 13 2011 |
Life Technologies Corporation |
Digital microscrope |
D708244, |
Nov 30 2012 |
Hitachi High-Technologies Corporation |
Electron microscope |
Date |
Maintenance Fee Events |
n/a
Date |
Maintenance Schedule |
n/a