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Patent
D687475
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Priority
May 10 2012
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Filed
Sep 12 2012
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Issued
Aug 06 2013
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Expiry
Aug 06 2027
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Assg.orig
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Entity
unknown
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7
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22
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n/a
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We claim the ornamental design for an electron microscope, as shown and described.
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FIG. 1 is a front, top and right side perspective view of an electron microscope showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a left side elevational view thereof;
FIG. 5 is a right side elevational view thereof;
FIG. 6 is a top plan view thereof; and,
FIG. 7 is a bottom plan view thereof.
The broken lines shown are for illustrative purpose and form no part of the claimed design.
Oonuma, Mitsuru, Omachi, Akira, Katane, Junichi, Komuro, Hiroyuki, Hirashima, Tomoyasu, Akatsu, Mitsuo
Patent |
Priority |
Assignee |
Title |
3297284, |
|
|
|
3814356, |
|
|
|
3835320, |
|
|
|
4523094, |
Feb 27 1981 |
Carl-Zeiss-Stiftung, Heidenheim/Brenz |
Evaluation device for electron-optical images |
5350921, |
Jul 29 1992 |
Hitachi, Ltd. |
Analytical electron microscope and a method of operating such an electron microscope |
5864138, |
Sep 14 1995 |
Hitachi, Ltd. |
Electron Microscope |
6084239, |
Sep 14 1995 |
Hitachi, Ltd. |
Electron microscope |
223669, |
|
|
|
D303267, |
Aug 07 1986 |
Olympus Optical Co., Ltd. |
Ultrasonic microscope |
D332616, |
Jan 26 1990 |
Hitachi, Ltd. |
Electronic microscope |
D381031, |
Jul 03 1995 |
Hitachi, Ltd. |
Electron microscope |
D623211, |
Mar 19 2009 |
HITACHI HIGH-TECH CORPORATION |
Electron microscope |
D625749, |
Mar 19 2009 |
HITACHI HIGH-TECH CORPORATION |
Electron microscope |
D626579, |
Sep 30 2009 |
HITACHI HIGH-TECH CORPORATION |
Electron microscope |
D632323, |
Sep 30 2009 |
HITACHI HIGH-TECH CORPORATION |
Electron microscope |
D633537, |
Sep 30 2009 |
HITACHI HIGH-TECH CORPORATION |
Electron microscope |
D633538, |
Sep 30 2009 |
HITACHI HIGH-TECH CORPORATION |
Electron microscope |
D635167, |
Sep 25 2009 |
HITACHI HIGH-TECH CORPORATION |
Portion of an electron microscope |
D635168, |
Sep 25 2009 |
HITACHI HIGH-TECH CORPORATION |
Portion of an electron microscope |
D636005, |
Jan 08 2010 |
Hitachi High-Technologies Corporation |
Electron microscope |
D638046, |
Feb 22 2010 |
HITACHI HIGH-TECH CORPORATION |
Electron microscope |
D644258, |
Feb 22 2010 |
HITACHI HIGH-TECH CORPORATION |
Electron microscope |
Date |
Maintenance Fee Events |
n/a
Date |
Maintenance Schedule |
n/a