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Patent
D626579
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Priority
Sep 30 2009
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Filed
Mar 02 2010
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Issued
Nov 02 2010
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Expiry
Nov 02 2024
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Assg.orig
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Entity
unknown
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17
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22
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n/a
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We claim the ornamental design for an electron microscope, as shown and described.
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FIG. 1 is a front, top and right side perspective view of an electron microscope showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a left side elevational view thereof;
FIG. 5 is a right side elevational view thereof;
FIG. 6 is a top plan view thereof; and,
FIG. 7 is a bottom plan view thereof.
The broken lines form no part of the claimed design.
Oonuma, Mitsuru, Omachi, Akira, Ajima, Masahiko, Ohtaki, Tomohisa
Patent |
Priority |
Assignee |
Title |
D633537, |
Sep 30 2009 |
HITACHI HIGH-TECH CORPORATION |
Electron microscope |
D633538, |
Sep 30 2009 |
HITACHI HIGH-TECH CORPORATION |
Electron microscope |
D635167, |
Sep 25 2009 |
HITACHI HIGH-TECH CORPORATION |
Portion of an electron microscope |
D635168, |
Sep 25 2009 |
HITACHI HIGH-TECH CORPORATION |
Portion of an electron microscope |
D636005, |
Jan 08 2010 |
Hitachi High-Technologies Corporation |
Electron microscope |
D638046, |
Feb 22 2010 |
HITACHI HIGH-TECH CORPORATION |
Electron microscope |
D644258, |
Feb 22 2010 |
HITACHI HIGH-TECH CORPORATION |
Electron microscope |
D647535, |
May 13 2010 |
ZF DO BRASIL LTDA |
Flange |
D656978, |
Mar 24 2011 |
NT-MDT Service & Logistics Ltd. |
Microscope |
D674830, |
Jul 08 2011 |
NT-MDT Service & Logistics Ltd. |
Microscope |
D687475, |
May 10 2012 |
HITACHI HIGH-TECH CORPORATION |
Electron microscope |
D697118, |
Mar 30 2012 |
Jeol Ltd |
Electron microscope |
D708245, |
Nov 30 2012 |
Hitachi High-Technologies Corporation |
Cover for an electron microscope |
D711950, |
Nov 30 2012 |
HITACHI HIGH-TECH CORPORATION |
Portion of a cover for an electron microscope |
D715843, |
Feb 22 2013 |
Shimadzu Corporation |
Mass microscope |
D724128, |
Sep 03 2013 |
Shimadzu Corporation |
Probe microscope |
D973745, |
Oct 07 2019 |
Shimadzu Corporation |
Probe microscope |
Patent |
Priority |
Assignee |
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Date |
Maintenance Fee Events |
n/a
Date |
Maintenance Schedule |
n/a