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Patent
D656978
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Priority
Mar 24 2011
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Filed
Mar 24 2011
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Issued
Apr 03 2012
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Expiry
Apr 03 2026
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Assg.orig
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Entity
unknown
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15
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18
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n/a
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The ornamental design for a microscope, as shown and described.
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FIG. 1 is a front perspective view of a microscope showing my new design;
FIG. 2 is a front view of the microscope shown in FIG. 1;
FIG. 3 is a rear view of the microscope shown in FIG. 1;
FIG. 4 is a right side view of the microscope shown in FIG. 1;
FIG. 5 is a left side view of the microscope shown in FIG. 1;
FIG. 6 is a top view of the microscope shown in FIG. 1; and,
FIG. 7 is a bottom view of the microscope shown in FIG. 1.
The broken lines depicting various portions of the microscope show unclaimed subject matter.
Stoiakine, Denis
Patent |
Priority |
Assignee |
Title |
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Jun 30 2011 |
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D884901, |
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Gemstone viewer |
ER4880, |
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ER9444, |
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Patent |
Priority |
Assignee |
Title |
5638171, |
Mar 03 1995 |
Hach Company |
Spectrophotometer with self-contained module |
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Dec 03 2004 |
KEYENCE CORPORATION |
Fluorescence microscope |
D244355, |
Aug 26 1975 |
AMERICAN CONSUMER PRODUCTS, INC , 31100 SOLON RD , SOLON, OH 44139 A CORP OF OH |
Display box |
D256726, |
Jun 16 1976 |
METTLER-TOLEDO AG METTLER-TOLEDO SA METTLER-TOLEDO LTD , IM LANGACHER GREIFENSEE, SWITZERLAND |
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Aug 26 1999 |
Agilent Technologies, Inc. |
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Sep 28 2001 |
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Jan 28 2004 |
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Dec 10 2007 |
Agilent Technologies, Inc |
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HITACHI HIGH-TECH CORPORATION |
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D625749, |
Mar 19 2009 |
HITACHI HIGH-TECH CORPORATION |
Electron microscope |
D626579, |
Sep 30 2009 |
HITACHI HIGH-TECH CORPORATION |
Electron microscope |
D630660, |
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Sep 30 2009 |
HITACHI HIGH-TECH CORPORATION |
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D633537, |
Sep 30 2009 |
HITACHI HIGH-TECH CORPORATION |
Electron microscope |
D636005, |
Jan 08 2010 |
Hitachi High-Technologies Corporation |
Electron microscope |
Date |
Maintenance Fee Events |
n/a
Date |
Maintenance Schedule |
n/a