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Patent
D632323
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Priority
Sep 30 2009
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Filed
Mar 02 2010
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Issued
Feb 08 2011
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Expiry
Feb 08 2025
TERM.DISCL.
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Assg.orig
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Entity
unknown
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16
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22
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n/a
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We claim the ornamental design for an electron microscope, as shown and described.
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FIG. 1 is front, top and right side perspective view of an electron microscope showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a left side elevational view thereof;
FIG. 5 is a right side elevational view thereof;
FIG. 6 is a top plan view thereof; and,
FIG. 7 is a bottom plan view thereof.
The broken lines form no part of the claimed design.
Oonuma, Mitsuru, Omachi, Akira, Ajima, Masahiko, Ohtaki, Tomohisa
Patent |
Priority |
Assignee |
Title |
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Feb 22 2010 |
HITACHI HIGH-TECH CORPORATION |
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D644258, |
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D711950, |
Nov 30 2012 |
HITACHI HIGH-TECH CORPORATION |
Portion of a cover for an electron microscope |
D715843, |
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D724128, |
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D876506, |
Apr 08 2017 |
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D878444, |
Apr 08 2017 |
Leica Microsystems CMS GmbH |
Microscope |
D933730, |
Feb 18 2020 |
Shimadzu Corporation |
Mass microscope |
D973745, |
Oct 07 2019 |
Shimadzu Corporation |
Probe microscope |
Patent |
Priority |
Assignee |
Title |
2424791, |
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Electron microscope |
Date |
Maintenance Fee Events |
n/a
Date |
Maintenance Schedule |
n/a