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Patent
D644258
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Priority
Feb 22 2010
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Filed
Jul 29 2010
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Issued
Aug 30 2011
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Expiry
Aug 30 2025
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Assg.orig
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Entity
unknown
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9
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28
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n/a
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We claim the ornamental design for an electron microscope, as shown and described.
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FIG. 1 is a front, top and right side perspective view of an electron microscope showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a top plan view thereof;
FIG. 5 is a bottom plan view thereof;
FIG. 6 is a left side elevational view thereof; and,
FIG. 7 is a right side elevational view thereof.
The broken lines shown are for illustrative purposes only and form no part of the claimed design.
Oonuma, Mitsuru, Noda, Hiroyuki, Omachi, Akira, Nemoto, Masahiro, Sasagawa, Kiyoshi
Patent |
Priority |
Assignee |
Title |
D654596, |
Oct 13 2010 |
AMO Development, LLC |
Medical system device |
D671654, |
Feb 20 2009 |
SII NANO TECHNOLOGY INC |
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D679026, |
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SII Nano Technology Inc. |
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D687475, |
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D706847, |
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Mitutoyo Corporation |
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D708244, |
Nov 30 2012 |
Hitachi High-Technologies Corporation |
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D708245, |
Nov 30 2012 |
Hitachi High-Technologies Corporation |
Cover for an electron microscope |
D711950, |
Nov 30 2012 |
HITACHI HIGH-TECH CORPORATION |
Portion of a cover for an electron microscope |
D851151, |
Jul 25 2017 |
HITACHI HIGH-TECH SCIENCE CORPORATION |
Microscope |
Patent |
Priority |
Assignee |
Title |
2424791, |
|
|
|
3814356, |
|
|
|
3835320, |
|
|
|
4523094, |
Feb 27 1981 |
Carl-Zeiss-Stiftung, Heidenheim/Brenz |
Evaluation device for electron-optical images |
4573772, |
Sep 05 1983 |
OLYMPUS OPTICAL CO , LTD |
Inverted-design microscope |
5350921, |
Jul 29 1992 |
Hitachi, Ltd. |
Analytical electron microscope and a method of operating such an electron microscope |
5864138, |
Sep 14 1995 |
Hitachi, Ltd. |
Electron Microscope |
5946131, |
Jul 16 1996 |
Perkin-Elmer Ltd. |
Microscope aperture control |
6084239, |
Sep 14 1995 |
Hitachi, Ltd. |
Electron microscope |
7046437, |
Jul 17 2000 |
Olympus Corporation |
Microscope provided with an objective lens focusing apparatus and an objective lens switching apparatus |
173282, |
|
|
|
223669, |
|
|
|
229581, |
|
|
|
233610, |
|
|
|
D303267, |
Aug 07 1986 |
Olympus Optical Co., Ltd. |
Ultrasonic microscope |
D332616, |
Jan 26 1990 |
Hitachi, Ltd. |
Electronic microscope |
D381031, |
Jul 03 1995 |
Hitachi, Ltd. |
Electron microscope |
D608810, |
Jul 15 2008 |
NT-MDT SERVICE & LOGISTICS LTD |
Microscope |
D623211, |
Mar 19 2009 |
HITACHI HIGH-TECH CORPORATION |
Electron microscope |
D625749, |
Mar 19 2009 |
HITACHI HIGH-TECH CORPORATION |
Electron microscope |
D626579, |
Sep 30 2009 |
HITACHI HIGH-TECH CORPORATION |
Electron microscope |
D632323, |
Sep 30 2009 |
HITACHI HIGH-TECH CORPORATION |
Electron microscope |
D633537, |
Sep 30 2009 |
HITACHI HIGH-TECH CORPORATION |
Electron microscope |
D633538, |
Sep 30 2009 |
HITACHI HIGH-TECH CORPORATION |
Electron microscope |
D636005, |
Jan 08 2010 |
Hitachi High-Technologies Corporation |
Electron microscope |
D638046, |
Feb 22 2010 |
HITACHI HIGH-TECH CORPORATION |
Electron microscope |
JP1233767, |
|
|
|
JP9733732, |
|
|
|
Date |
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