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Patent
D708244
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Priority
Nov 30 2012
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Filed
May 30 2013
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Issued
Jul 01 2014
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Expiry
Jul 01 2028
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Assg.orig
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Entity
unknown
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5
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18
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n/a
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We claim the ornamental design for an electron microscope, as shown and described.
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FIG. 1 is a front, top and right side perspective view of an electron microscope showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a left side elevational view thereof;
FIG. 5 is a right side elevational view thereof;
FIG. 6 is a top plan view thereof;
FIG. 7 is a bottom plan view thereof; and,
FIG. 8 is an enlarged view of the portion indicated by lines 8 in FIG. 2.
The broken lines of FIG. 8 are for illustrative purposes of the boundaries of the enlarged view and form no part of the claimed design.
Suzuki, Hiroyuki, Sakamoto, Naoki, Sato, Hirofumi, Moriya, Toshiyuki, Matoba, Kosuke
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Feb 27 1981 |
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Nov 05 1988 |
SEIKO INSTRUMENTS INC , A CORP OF JAPAN |
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Electron microscope |
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Feb 22 2010 |
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HITACHI HIGH-TECH CORPORATION |
Electron microscope |
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May 10 2012 |
HITACHI HIGH-TECH CORPORATION |
Electron microscope |
| Date |
Maintenance Fee Events |
n/a
| Date |
Maintenance Schedule |
n/a