Patent
   D973745
Priority
Oct 07 2019
Filed
Feb 24 2022
Issued
Dec 27 2022
Expiry
Dec 27 2037
Assg.orig
Entity
unknown
0
8
n/a
The ornamental design for a probe microscope, as shown and described.

FIG. 1 is a perspective view of a probe microscope showing my new design;

FIG. 2 is another perspective view thereof;

FIG. 3 is a front view thereof;

FIG. 4 is a rear view thereof;

FIG. 5 is a left side view thereof;

FIG. 6 is a right side view thereof;

FIG. 7 is a top view thereof; and,

FIG. 8 is a bottom view thereof.

Takegawa, Ryo

Patent Priority Assignee Title
Patent Priority Assignee Title
D608810, Jul 15 2008 NT-MDT SERVICE & LOGISTICS LTD Microscope
D626579, Sep 30 2009 HITACHI HIGH-TECH CORPORATION Electron microscope
D632323, Sep 30 2009 HITACHI HIGH-TECH CORPORATION Electron microscope
D687475, May 10 2012 HITACHI HIGH-TECH CORPORATION Electron microscope
D724128, Sep 03 2013 Shimadzu Corporation Probe microscope
D887295, May 31 2018 Micromass UK Limited Mass spectrometer
D933730, Feb 18 2020 Shimadzu Corporation Mass microscope
D956120, Oct 07 2019 Shimadzu Corporation Probe microscope
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Feb 24 2022Shimadzu Corporation(assignment on the face of the patent)
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