An electronic device includes a first substrate having a wiring trace, a second substrate having an external terminal, a first electronic component disposed on a first surface of the first substrate, a second electronic component electrically connected to the first electronic component and disposed on a second surface of the first substrate, a mold layer encapsulating the first electronic component, and a conductive member disposed in the mold layer. The conductive member electrically connects the first substrate to the second substrate. A step is formed at an end of the mold layer, and the conductive member is exposed at the step. A distance between the first substrate and the second substrate is smaller than a distance between the first surface of the first substrate and a surface of the first electronic component that is positioned opposite to the first substrate.
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1. An electronic device, comprising:
a first substrate having a wiring trace formed therein;
a first electronic component disposed on a first surface of the first substrate;
a second electronic component disposed on a second surface of the first substrate that is opposite to the first surface, with the second electronic component being electrically connected to the first electronic component by the wiring trace;
a mold layer encapsulating the first electronic component;
a second substrate having an external terminal formed thereon;
a conductive member disposed in the mold layer and electrically connecting the first substrate to the second substrate; and
a step disposed at an end of the mold layer, such that the conductive member is exposed at the step,
wherein the second substrate is disposed at the step, and
wherein, in a thickness direction of the first substrate, a distance between the first substrate and the second substrate is smaller than a distance between the first surface of the first substrate and a surface of the first electronic component that is opposite to the first substrate.
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The present application is a continuation of PCT/JP2019/007780, filed Feb. 28, 2019, which claims priority to Japanese Patent Application No. 2018-088117, filed May 1, 2018, the entire contents of each of which are incorporated herein by reference.
The present disclosure relates to an electronic device and a fingerprint recognition apparatus equipped with the electronic device, and more particularly, to a technique to reduce the height of the electronic device that serves as a sensor for the fingerprint recognition apparatus.
In recent years, fingerprint recognition apparatuses used for performing personal identification have come into wide use for enhancing security. A fingerprint recognition apparatuses is used in various ways, for example, as an electronic key disposed at an entrance of a building, as used with an automatic telling machine (ATM), or as used in a portable electronic appliance, such as a mobile phone or a smartphone.
Japanese Unexamined Patent Application Publication (Translation of PCT Application) No. 2017-511162 (hereinafter referred to as “Patent Document 1”) discloses an electronic device to be used for a fingerprint recognition apparatus. The electronic device disclosed in Patent Document 1 includes a sensor electrode for detecting fingerprints, an integrated circuit electrically connected to the sensor electrode, a first circuit substrate that is positioned above the integrated circuit and on which the sensor electrode is mounted, a second circuit substrate that is positioned below the integrated circuit and electrically connected to the first circuit substrate, a molding layer for protecting the integrated circuit, and a connection portion that electrically connects the first circuit substrate and the second circuit substrate.
In general, size and thickness reduction is highly demanded for portable electronic appliances, which necessitates size and thickness reduction of fingerprint recognition apparatuses to be used for the portable electronic appliances.
The electronic device for the fingerprint recognition apparatus disclosed in Patent Document 1, however, is configured such that the second circuit substrate is disposed below the integrated circuit. Reducing the height of the device may face difficulties due to the second circuit substrate interfering with the integrated circuit. In other words, the idiosyncratic feature of the electronic device for the fingerprint recognition apparatus disclosed in Patent Document 1 may pose difficulties in reducing the height of the device.
Accordingly, it is an object of the present disclosure to reduce the height of an electronic device to be used for a fingerprint recognition apparatus.
According to an exemplary aspect, an electronic device is provided that includes a first substrate having a wiring trace formed therein, a first electronic component disposed on a first surface of the first substrate, and a second electronic component disposed on a second surface of the first substrate. The second surface is opposite to the first surface, and the second electronic component is electrically connected to the first electronic component through the wiring trace. Moreover, the electronic device also includes a mold layer encapsulating the first electronic component, and a second substrate in which an external terminal is formed. The electronic device further includes a conductive member disposed in the mold layer and electrically connecting the first substrate and the second substrate to each other. A step (or step portion) is formed at an end of the mold layer, and the conductive member is exposed at the step. Moreover, the second substrate is disposed at the step. In a thickness direction of the first substrate, a distance between the first substrate and the second substrate is smaller than a distance between the first surface of the first substrate and a surface of the first electronic component that is positioned opposite to the first substrate.
According to another exemplary aspect, a fingerprint recognition apparatus is equipped with the above-described electronic device.
The electronic device according to the present disclosure is configured such that the second substrate is disposed at the step formed at the end of the mold layer, and in the thickness direction of the first substrate, the distance between the first substrate and the second substrate is smaller than the distance between the first surface of the first substrate and the surface of the first electronic component that is positioned opposite to the first substrate. With this configuration, the entire second substrate does not protrude from the mold layer, which suppresses an increase in the total thickness of the electronic device caused by the presence of the second substrate. Thus, the height of the electronic device can be reduced.
Exemplary embodiments and aspects of the present disclosure will be described in detail with reference to the drawings. It is noted that the same or similar elements in the drawings are denoted by the same reference signs, and repetitive explanation will be omitted.
As illustrated in
For example, an ultrasonic sensor is formed on the sensor substrate 110. When a user places a finger on the surface of the sensor substrate 110, an electric signal corresponding to irregularities of the fingerprint is generated. The electric signal generated in the sensor substrate 110 is transmitted to another device through wiring traces (not illustrated) formed by patterning in the wiring substrate 120 and also through the conductive member 150 and the terminal substrate 160.
The integrated circuit 141 and the capacitor 142 for noise reduction are disposed on a first surface 121 of the wiring substrate 120. The sensor substrate 110 is disposed on a second surface 122 of the wiring substrate 120 that is opposite the first surface 121. The wiring substrate 120 has a multilayer structure in which wiring traces are formed by patterning. The integrated circuit 141 and the capacitor 142 are electrically connected to the sensor substrate 110 by the wiring traces formed in the wiring substrate 120.
The mold layer 130 is made, for example, of a resin. The mold layer 130 encapsulates the integrated circuit 141 and the capacitor 142 on the first surface 121 of the wiring substrate 120. A step 170 (also referred to as a “step port”) where the resin layer is made thin is formed at an edge of the mold layer 130. It is also noted that a thick part of the mold layer 130 is referred to as a “thick mold portion 131”, while a thin part of the mold layer 130 at which the step portion 170 is formed is referred to as a “thin mold portion 132”. The conductive member 150 is formed in the thin mold portion 132 so as to penetrate the mold layer 130 and be electrically connected to the wiring substrate 120. According to an exemplary aspect, the conductive member 150 is a columnar member made of an electrically conductive metal, such as copper, silver, gold, or aluminum. The conductive member 150 is exposed from the mold layer 130 at the step portion 170. It is noted that in the following description, the integrated circuit 141 and the capacitor 142 may be collectively referred to as “built-in components 140”.
The terminal substrate 160 is a connector that transmits electric signals generated in the sensor substrate 110 to other devices (not illustrated). The terminal substrate 160 is a flexible circuit substrate preferably made of flexible materials. The dielectric substance of the terminal substrate 160 is, for example, a resin, such as an epoxy resin or a polyimide resin. Alternatively, the dielectric substance of the terminal substrate 160 may be a liquid crystal polymer (LCP) or a fluoro-resin. The terminal substrate 160 may be formed of a thermoplastic rigid circuit substrate.
As further shown, the terminal substrate 160 includes a terminal 161 exposed at one end of the terminal substrate 160, an external terminal 163 exposed at the other end thereof, and wiring traces 162. The wiring traces 162 are formed in the substrate and connect the terminal 161 to the external terminal 163 electrically. The terminal substrate 160 is disposed at the step portion 170 of the mold layer 130, and the terminal 161 is connected electrically to the conductive member 150.
A thickness H2 of the thin mold portion 132 at which the step portion 170 is formed (in other words, a distance in the thickness or vertical direction between the wiring substrate 120 and the terminal substrate 160) is smaller than the smallest distance H1 between the first surface 121 of the wiring substrate 120 and surfaces of the built-in components 140 that are the surfaces positioned opposite to the wiring substrate 120 (i.e., facing away from wiring substrate 120). With this configuration, the entire terminal substrate 160 does not protrude from the mold layer 130, which suppresses an increase in the total thickness of the electronic device 100 caused by the presence of the terminal substrate 160. Thus, the height of the electronic device 100 can be reduced compared with conventional designs.
As illustrated in
It is preferable that the sealing resin material be a low hygroscopicity material, such as an epoxy resin. Using the low hydroscopicity resin material can suppress corrosion at connection portions and deterioration of insulating films of the components encapsulated in the mold, which can improve the reliability of the electronic device. It is also preferable that the sealing resin material have a coefficient of linear expansion close to that of the built-in components encapsulated in the mold layer 130. Using the sealing resin material having a similar coefficient of linear expansion reduces thermal stress generated due to the difference of the coefficient of linear expansion caused by a temperature change. This can suppress breakage of the electronic device 100 due to strains or clacks.
The support base 50 is removed after the mold layer 130 is formed (
After the wiring substrate 120 is formed, the sensor substrate 110 is disposed on the wiring substrate 120. Thus, the built-in components 140 in the mold layer 130 and the sensor substrate 110 are electrically connected by the wiring traces formed in the wiring substrate 120.
Next, the step 170 (i.e., step portion) is formed by cutting an end portion of the mold layer 130 halfway using a dicing machine, which exposes the conductive member 150 from the sealing resin material (
In
Finally, the electronic device 100 is produced by disposing the terminal substrate 160 at the step portion 170 (
Regarding the corner 172 that is susceptible to stress concentration, the mold layer 130, and the terminal substrate 160 as well, may be rounded as illustrated in
It is also noted that the breakage of the corner 172 due to the stress concentration can be avoided using other configurations. First through third refinements of the exemplary aspects described below are examples in which the corner 172 is made of materials that are different from the sealing resin material.
It is noted that the material having a high modulus of elasticity may be, for example, a resin mixed with an inorganic filler, such as silica or alumina.
According to an exemplary aspect, the less elastic material may be, for example, a polyimide resin, a bismaleimide resin, a polyamide resin, a polyamide-imide resin, a polybenzoxazole resin, a benzocyclobutene resin, an aramid resin, a silicone resin, or a liquid crystal polymer.
It is noted that the configurations of the second and third refinements of exemplary aspects may be implemented by filling the resin 180 (or the resin 182) only partially so as to encapsulate the conductive member 150 before forming the mold layer 130 in the step in the manufacturing process illustrated in
Wiring Trace Arrangement in Wiring Substrate
In the case of an ultrasonic sensor being used as the sensor for fingerprint recognition, the arrangement of wiring traces in the wiring substrate 120 on which the sensor substrate 110 is disposed may influence the detection accuracy of the sensor.
The wiring traces made of a metallic material, such as copper, and the insulating layer made of a resin have different moduli of elasticity and different densities. The reflectivity of ultrasonic wave is also different. As illustrated in
Here, uneven loads are applied to the sensor substrate 110 because wiring traces 125 have a density different from that of a resin portion without the wiring traces 125 at the contact surface between the sensor substrate 110 and the wiring substrate 120. This may cause the sensor substrate 110 to deform unevenly and thereby attenuate an ultrasonic wave unevenly at a detection surface of the sensor substrate 110.
Moreover, if the wiring traces 125 are disposed immediately under the sensor substrate 110, reflection of ultrasonic waves may become uneven between a portion at which each wiring trace 125 is in contact with the sensor substrate 110 and a portion at which the resin is in contact with the sensor substrate 110.
If the reflection of ultrasonic waves becomes different depending on presence or absence of the wiring trace 125 as described above, an image of the wiring traces 125 may be transferred onto an image of a detected fingerprint.
Accordingly, in the wiring substrate 120, the wiring traces 125 are not basically disposed immediately under the sensor substrate 110 (i.e., on the second surface 122), and the wiring traces 125 are preferably not in contact with sensor substrate 110. In other words, as illustrated in
It is also noted that depending on the type of resin to be used for the insulating layer, the detection image may be influenced considerably by the reflection at the wiring traces 125 even if the wiring traces 125 are formed on an inner layer of the wiring substrate 120. In such a case, as illustrated in
As illustrated in
Uchida, Takeshi, Iwamoto, Takashi
Patent | Priority | Assignee | Title |
12131571, | Aug 10 2022 | Samsung Electronics Co., Ltd. | Fingerprint sensor package and smart card having the same |
Patent | Priority | Assignee | Title |
10055631, | Nov 03 2015 | Synaptics Incorporated | Semiconductor package for sensor applications |
10229306, | Jan 29 2014 | SAMSUNG ELECTRONICS CO , LTD | Fingerprint recognition device, method of manufacturing the same, and electronic device thereof |
10672972, | Feb 27 2015 | FUJIFILM Healthcare Corporation | Ultrasonic transducer unit |
6551248, | Jul 31 2001 | Koninklijke Philips Electronics N V | System for attaching an acoustic element to an integrated circuit |
7192798, | Feb 20 2002 | Fujitsu Semiconductor Limited | Fingerprint sensor apparatus and manufacturing method thereof |
7424136, | Oct 18 2006 | Apple Inc | Finger sensing with enhanced mounting and associated methods |
8736001, | Jun 18 2010 | Apple Inc | Finger sensor including encapsulating layer over sensing area and related methods |
8888004, | Oct 08 2010 | Apple Inc | Finger sensing device including differential measurement circuitry and related methods |
9263315, | Mar 30 2010 | DAI NIPPON PRINTING CO , LTD | LED leadframe or LED substrate, semiconductor device, and method for manufacturing LED leadframe or LED substrate |
9443126, | Nov 20 2012 | CRUCIALTEC CO , LTD | Fingerprint sensor module, portable electronic device including same, and method for manufacturing same |
9613249, | Jun 18 2010 | Apple Inc. | Finger sensor including encapsulating layer over sensing area and related methods |
9691708, | Jul 20 2016 | Taiwan Semiconductor Manufacturing Co., Ltd. | Semiconductor package and manufacturing method thereof |
9960512, | May 13 2013 | Murata Manufacturing Co., Ltd. | Flexible circuit board and device |
20030028108, | |||
20030156743, | |||
20060057756, | |||
20090069689, | |||
20110042812, | |||
20110298711, | |||
20110309482, | |||
20120085822, | |||
20130015743, | |||
20140205161, | |||
20150380848, | |||
20160066429, | |||
20160254429, | |||
20160350572, | |||
20170229769, | |||
20170344872, | |||
20170357838, | |||
20180040805, | |||
20180108618, | |||
20180343332, | |||
20200043835, | |||
20200183465, | |||
20200243453, | |||
20200258839, | |||
20200267479, | |||
20200281102, | |||
20200328143, | |||
JP2003235830, | |||
JP2004056504, | |||
JP2005242841, | |||
JP2005507581, | |||
JP2009061112, | |||
JP2013534008, | |||
JP2013541773, | |||
JP2016048723, | |||
JP2016163132, | |||
JP2017511162, | |||
WO2014185194, |
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