Embodiments of the disclosure provide a micromachined mirror assembly. The micromachined mirror assembly includes a micro mirror configured to tilt around an axis and a first and a second torsion beam each having a first and a second end. The second end of the first torsion beam and the second end of the second torsion beam are mechanically coupled to the micro mirror along the axis. The micromachined mirror assembly also includes a first DC voltage applied to the first end of the first torsion beam and a second DC voltage, different from the first DC voltage, is applied to the first end of the second torsion beam.
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20. A method for driving a micromachined mirror assembly, comprising:
operating the micromachined mirror assembly by tilting a micro mirror around an axis; and
dynamically tuning a resonant frequency of the micro mirror during the operation of the micromachined mirror assembly by adjusting a voltage difference applied to a first torsion beam and a second torsion beam each mechanically coupled to the micro mirror along the axis or a tensional stress along the axis.
14. A micromachined mirror assembly, comprising:
a micro mirror configured to tilt around an axis;
a first torsion beam and a second torsion beam each mechanically coupled to the micro mirror along the axis, wherein a voltage difference is applied to the first torsion beam and the second torsion beam; and
at least one actuator mechanically coupled to at least one of the first torsion beam or the second torsion beam, wherein the at least one actuator causes a tensional stress along the axis.
1. A micromachined mirror assembly, comprising:
a micro mirror configured to tilt around an axis; and
a first torsion beam having a first end to which a first voltage is applied and a second end mechanically coupled to the micro mirror along the axis; and
a second torsion beam having a first end to which a second voltage is applied and a second end mechanically coupled to the micro mirror along the axis,
wherein the first voltage and the second voltage has an adjustable voltage difference.
2. The micromachine mirror assembly of
3. The micromachine mirror assembly of
4. The micromachine mirror assembly of
5. The micromachine mirror assembly of
6. The micromachine mirror assembly of
7. The micromachine mirror assembly of
8. The micromachine mirror assembly of
at least one actuator mechanically coupled to at least one of the first torsion beam or the second torsion beam,
wherein the at least one actuator causes a tensional stress along the axis.
9. The micromachine mirror assembly of
a first torsional actuator coupled to the first torsion beam and configured to apply a first torsional stress around the axis to the first torsion beam; and the
a second torsional actuator coupled to the second torsion beam and configured to apply a second torsional stress around the axis to the second torsion beam,
wherein a difference between the first torsional stress and the second torsional stress causes the tensional stress along the axis.
10. The micromachine mirror assembly of
11. The micromachine mirror assembly of
12. The micromachine mirror assembly of
13. The micromachine mirror assembly of
15. The micromachine mirror assembly of
16. The micromachine mirror assembly of
17. The micromachine mirror assembly of
18. The micromachine mirror assembly of
a first torsional actuator coupled to the first torsion beam and configured to apply a first torsional stress around the axis to the first torsion beam; and
a second torsional actuator coupled to the second torsion beam and configured to apply a second torsional stress around the axis to the second torsion beam,
wherein a difference between the first torsional stress and the second torsional stress causes the tensional stress along the axis.
19. The micromachine mirror assembly of
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This is a continuation to U.S. application Ser. No. 16/658,007, filed Oct. 18, 2019, which is incorporated by reference in its entirety herein.
The present disclosure relates to a micromachined mirror assembly, and more particularly to, a micromachined mirror assembly used in a scanner for light detection and ranging (LiDAR).
LiDAR systems have been widely used in autonomous driving and producing high-definition maps. For example, LiDAR systems measure distance to a target by illuminating the target with pulsed laser light and measuring the reflected pulses with a sensor. Differences in laser return times and wavelengths can then be used to make digital three-dimensional (3-D) representations of the target. The laser light used for LiDAR scan may be ultraviolet, visible, or near infrared. Because using a narrow laser beam as the incident light from the scanner can map physical features with very high resolution, a LiDAR system is particularly suitable for applications such as high-definition map surveys.
The scanner of a LiDAR system includes a mirror that can be moved (e.g., rotated) by actuators to reflect (and steer) incident laser beams from a laser source towards a predetermined angle. The mirror can be a single, or an array of micromachined mirror assembly(s) made by semiconductor materials using microelectromechanical system (MEMS) technologies. In order to maximize the deflection angle of the micromachined mirror assemblies for a given voltage, they are operated in their resonant frequency. However, due to fabrication process variations, resonant frequency of each of the micromachined mirror of the same array of micromachined mirror assembly(s) may vary. For example, structures etched on a single crystalline wafer may suffer from greater fabrication process variations (e.g., the lower part of the structure is narrower than the design due to the etching process) when the structure is closer to the edge of the wafer comparing to structures that is located in the center of the wafer. Thus, achieving the target resonant frequency becomes especially important when multiple micro mirrors need to be synchronized to operate at the same resonant frequency.
Embodiments of the disclosure address the above problems by an improved micromachined mirror assembly in a scanner for LiDAR.
Embodiments of the disclosure provide a micromachined mirror assembly. The micromachined mirror assembly includes a micro mirror configured to tilt around an axis and a first and a second torsion beam each having a first and a second end. The second end of the first torsion beam and the second end of the second torsion beam are mechanically coupled to the micro mirror along the axis. The micromachined mirror assembly also includes a first DC voltage applied to the first end of the first torsion beam and a second DC voltage, different from the first DC voltage, is applied to the first end of the second torsion beam.
Embodiments of the disclosure also provide another micromachined mirror assembly. The micromachined mirror assembly includes a micro mirror configured to tilt around an axis and a first and a second torsion beam each mechanically coupled to the micro mirror along the axis. The micromachined mirror assembly also includes a first torsional actuator mechanically coupled to the first torsion beam and configured to apply a first torsional stress around the axis to the first torsion beam and a second actuator mechanically coupled to the second torsion beam and configured to apply a second torsional stress around the axis to the second torsion beam. The micromachined mirror assembly further includes a DC voltage difference applied to the first torsion beam and the second torsion beam.
Embodiments of the disclosure also provide a method for driving a micromachined mirror assembly. A resonant frequency of the micromachined mirror assembly is set at an initial value. A DC voltage difference along an axis of the micromachined mirror assembly to decrease the resonant frequency to a first operational value lower than the initial value during operation of the micromachined mirror assembly.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the invention, as claimed.
Reference will now be made in detail to the exemplary embodiments, examples of which are illustrated in the accompanying drawings. Wherever possible, the same reference numbers will be used throughout the drawings to refer to the same or like parts.
As illustrated in
Consistent with some embodiments, LiDAR system 102 and sensor 110 may be configured to capture data as vehicle 100 moves along a trajectory. For example, a transmitter of LiDAR system 102 is configured to scan the surrounding and acquire point clouds. LiDAR system 102 measures distance to a target by illuminating the target with pulsed laser beam and measuring the reflected pulses with a receiver. The laser beam used for LiDAR system 102 may be ultraviolet, visible, or near infrared. In some embodiments of the present disclosure, LiDAR system 102 may capture point clouds. As vehicle 100 moves along the trajectory, LiDAR system 102 may continuously capture data. Each set of scene data captured at a certain time range is known as a data frame.
As part of LiDAR system 102, transmitter 202 can sequentially emit a stream of pulsed laser beams in different directions within its scan angle, as illustrated in
In some embodiments of the present disclosure, laser source 206 is a pulsed laser diode (PLD). A PLD may be a semiconductor device similar to a light-emitting diode (LED) in which the laser beam is created at the diode's junction. In some embodiments of the present disclosure, a PLD includes a PIN diode in which the active region is in the intrinsic (I) region, and the carriers (electrons and holes) are pumped into the active region from the N and P regions, respectively. Depending on the semiconductor materials, the wavelength of incident laser beam 207 provided by a PLD may be smaller than 1,100 nm, such as 405 nm, between. 445 nm and 465 nm, between 510 nm and 525 nm, 532 nm, 635 nm, between 650 nm and 660 nm, 670 nm, 760 nm, 785 nm, 808 nm, or 848 nm.
Scanner 210 may be configured to emit a laser beam 209 to an object 212 in a first direction. Object 212 may be made of a wide range of materials including, for example, non-metallic objects, rocks, rain, chemical compounds, aerosols, clouds and even single molecules. The wavelength of laser beam 209 may vary based on the composition of object 212. At each time point during the scan, scanner 210 may emit laser beam 209 to object 212 in a direction within the scan angle by rotating the micromachined mirror assembly as the incident angle of incident laser beam 207 may be fixed. In some embodiments of the present disclosure, scanner 210 may also include optical components (e.g., lenses, mirrors) that can focus pulsed laser light into a narrow laser beam to increase the scan resolution and range of object 212.
As part of LiDAR system 102, receiver 204 may be configured to detect a returned laser beam 211 returned from object 212 in a different direction. Receiver 204 can collect laser beams returned from object 212 and output electrical signal reflecting the intensity of the returned laser beams. Upon contact, laser light can be reflected by object 212 via backscattering, such as Rayleigh scattering, Mie scattering, Raman scattering, and fluorescence. As illustrated in
Photodetector 216 may be configured to detect returned laser beam 211 returned from object 212. Photodetector 216 may convert the laser light (e.g., returned laser beam 211) collected by lens 214 into an electrical signal 218 (e.g., a current or a voltage signal). The current is generated when photons are absorbed in the photodiode. In some embodiments of the present disclosure, photodetector 216 may include an avalanche photodiode (APD), such as a single photon avalanche diode (SPAD), a SPAD array, or a silicon photo multiplier (SiPM).
Although scanner 210 is described as part of transmitter 202, it is understood that in some embodiments, scanner 210 can be part of receiver 204, e.g., before photodetector 216 in the light path. The inclusion of scanner 210 in receiver can ensure that photodetector 216 only captures light, e.g., returned laser beam 211 from desired directions, thereby avoiding interferences from other light sources, such as the sun and/or other LiDAR systems. By increasing the aperture of mirror assembly in scanner 210 in receiver 204, the sensitivity of photodetector 216 can be increased as well.
As described above, the incident angle of incident laser beam 207 may be fixed relative to scanner 210, and the scanning of laser beam 209 may be achieved by rotating a single micro mirror or an array of micromachined mirror assembly in scanner 210.
As illustrated in
Micromachined mirror assembly 300 may further include a pair of first and second anchors 308 and 310 each mechanically coupled to a respective end of torsion beam 304 or 306 that is farther away from micro mirror 302 and along axis 303. The other end of torsion beam 304 or 306 is mechanically coupled to micro mirror 302. Each one of anchors 308 and 310 is affixed on a base (not shown) of micromachined mirror assembly 300, according to some embodiments. Anchors 308 and 310 may be affixed to the base as both are formed using MEMS microfabrication techniques from a same rigid semiconductor structure, such as a single crystalline silicon wafer or may be joined together using thermal bonding, adhesive bonding, or soldering. Each one of torsion beams 304 and 306 is suspended from the base, i.e., leaving a space therebetween, to allow certain movement (e.g., rotation and/or displacement) of torsion beams 304 and 306 with respect to the base and anchors 308 and 310. In some embodiments, each one of torsion beams 304 and 306 is configured to tilt around axis 303, thereby driving the rotation of micro mirror 302. In some embodiments, each one of torsion beams 304 and 306 is made of a rigid material, such as silicon, with substantially zero displacement in a direction along axis 303 (i.e., the axial direction).
As illustrated in
On the other hand, the heat may also cause thermal expansion of torsion beams 304 and 306, and thus be transformed into compression stresses applied to micro mirror 302. The thermal expansion and the compression stresses may cause a decrease of the operational resonant frequency of micro mirror 302. In some embodiments, the change of operational resonant frequency of micro mirror 302 may be calculated by equation (1):
where fnom is the center frequency of micro mirror 302 at a nominal temperature T0 and with VP=0V, km is the integrated mechanical stiffness of micro mirror 302 at its midpoint, do is the electrode-to-torsion beam gap spacing at To, We is the width of the electrode, Le is the length of the suspended portion of the electrode (that is free to expand), αe and αsub are the thermal expansion coefficients of the electrode and substrate materials, respectively.
In some embodiments, first DC voltage Vi and second DC voltage V0 is maintained during the operation of micromachined mirror assembly 300, thereby tuning the operational resonant frequency of micro mirror 302 from its initial resonant frequency. For one specific example, the DC voltage difference between first voltage Vi and second DC voltage V0 may be about 3V (e.g., 0V for first DC voltage Vi and −3V for second DC voltage V0, or 3V for first voltage Vi and 0V for second DC voltage V0). Current i0 may be about 100 mA based on the electrical resistance of all components of micromachined mirror assembly 300 along axis 303. The heat generated on torsion beams 304 and 306 and micro mirror 302 may be transformed into thermal expansion and compression stresses applied to micro mirror 302 causing the operational resonant frequency of micro mirror 302 to decrease from about 5000 Hz to about 4950 Hz.
In some embodiments, an electrical resistance R may be added between the electrodes as part of an overload protection circuit to protect the circuit from overcurrent. It is understood that the direction of current i0 may not affect the decrease of the operational resonant frequency of micro mirror 302.
As illustrated in
In some other embodiments, the first torsional stress and second torsional stress may have different magnitudes resulting in torsional stresses on torsion beams 304 and 306. For example, first and second actuators 312 and 314 may create unbalanced torsional stresses on torsion beams 304 and 306 on different sides of micro mirror 302 along axis 303. The unbalanced torsional stresses (i.e., a torsion) can be translated into a tensional stress in the axial direction, which can increase the resonant frequency of micro mirror 302. In some embodiments, the tensional stress caused by the torsion is maintained during the operation of micromachined mirror assembly 300, thereby tuning the operational resonant frequency of micro mirror 302 from its initial resonant frequency. It is understood that the direction of torsion may not affect the increase of the operational resonant frequency of micro mirror 302. That is, the first torsional stress applied by first actuator 312 may be greater than the second torsional stress applied by second actuator 314, or vice versa.
As illustrated in
In some embodiments, the unbalanced torsional stresses created by first and second actuators 312 and 314 are achieved by applying two different AC voltages V1 and V2 to first and second actuators 312 and 314, respectively. The difference between AC voltages V1 and V2 may be converted into the magnitude difference of the first and second torsional stresses by a pair of electrostatic actuators, such as two sets of comb drives, as shown in
It is understood that the type of electrostatic actuators for creating unbalanced torsional stresses is not limited to comb drive actuators and can include any other suitable electrostatic actuators, such as parallel plate electrostatic actuators, rotational electrostatic actuators, or cantilever electrostatic actuators, to name a few. It is also understood that the type of actuators for creating unbalanced torsional stresses is not limited to electrostatic actuators and can include any other suitable actuators, such as piezoelectric actuators, electromagnetic actuators, thermal actuators, etc.
As described above, the current introduced by first DC voltage Vi and second DC voltage V0 may decrease the resonant frequency of micro mirror 302 from its initial resonant frequency and optionally in some embodiments, the torsion induced by first and second actuators 312 and 314 can increase the resonant frequency of micro mirror 302 from its initial resonant frequency. In some embodiments, a controller (not shown) is configured to dynamically tune the operational resonant frequency of micro mirror 302 by adjusting the voltage signals V1 and V2 applied to first and second actuators 312 and 314 and/or adjusting the current i0 passes through torsion beams 304 and 306 and micro mirror 302 by adjusting first DC voltage Vi and second DC voltage V0 applied to torsion beams 304 and 306.
In addition to indirectly translating a torsion into the tensional stress, another way to introducing tensional stress for increasing resonant frequency of a micro mirror is to directly apply a tensional stress through one or two suspended beams along the axis of the micro mirror. For example,
As shown in
For example,
In one design as shown in
In another design as shown in
As described above, the current introduced by first DC voltage Vi and second DC voltage V0 may decrease the resonant frequency of micro mirror 502 from its initial resonant frequency and in some embodiments, optionally, the tensional stress induced directly by tensional actuators 516 and/or 518 can increase the resonant frequency of micro mirror 502 from its initial resonant frequency. In some embodiments, a controller (not shown) is configured to dynamically tune the operational resonant frequency of micro mirror 502 by adjusting torsional stress on tensional actuators 516 and/or 518, and/or adjusting the current i0 passes through torsion beams 504 and 506 and micro mirror 502 by adjusting first DC voltage Vi and second DC voltage V0. In some embodiments, an electrical resistance R may be added between the electrodes as part of an overcurrent protection circuit to protect the circuit from overcurrent.
In step S702, a resonant frequency of a micromachined mirror assembly is set at an initial value. The initial value may be pre-set by the design and fabrication process of the micromachined mirror assembly. In some embodiments, the initial value is pre-set as the maximized value, which can be decreased to a lower value during the operation by decreasing the resonant frequency during the operation of the micromachined mirror assembly.
In step S704, a DC voltage difference is applied along an axis of the micromachined mirror assembly to decrease the resonant frequency to a first operational value lower than the initial value during operation of the micromachined mirror assembly. In some embodiments, the DC voltage difference results in a current to pass through the torsion beams, and the micro mirror. The current may be transformed into heat on the torsion beams and the micro mirror. The heat may be transformed into thermal expansion thus lead to compression stresses applied to the micro mirror. The thermal expansion and the compression stresses may cause a decrease of the operational resonant frequency, thereby decreasing the first operational value. In some embodiments, the initial value of the resonant frequency is pre-set as the maximum value, such that the operational resonant frequency is decreased to the desired second operational value by applying a suitable level of heat to the micromachined mirror assembly.
It is understood that in some embodiments, the initial value of the resonant frequency of the micromachined mirror assembly is not pre-set at the maximum value, and step S704 can be performed in any suitable times to dynamically tune the initial value to a desired operational value.
It will be apparent to those skilled in the art that various modifications and variations can be made to the disclosed system and related methods. Other embodiments will be apparent to those skilled in the art from consideration of the specification and practice of the disclosed system and related methods.
It is intended that the specification and examples be considered as exemplary only, with a true scope being indicated by the following claims and their equivalents.
Zhou, Qin, Wang, Youmin, Lee, Sae Won
Patent | Priority | Assignee | Title |
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