A voltage regulator has an output path to couple to a load. A first sense point at a first sense location on the output path is to sense a first feedback signal for the voltage regulator. And, a second sense point at a second sense location on the output path is to sense a second feedback signal for the voltage regulator.
|
22. A method comprises:
sensing a first feedback signal at a first sense location on an output path;
filtering transient components from the first feedback signal to capture steady-state feedback;
sensing a second feedback signal at a second sense location on the output path;
filtering a steady-state component from the second feedback signal to capture transient feedback; and
regulating a voltage to power an electrical component on the output path based at least in part on a combination of the steady-state feedback and the transient feedback, said steady-state feedback and said transient feedback to at least partially represent fluctuations in a power consumption rate of the electrical component during operation.
13. An apparatus comprising:
a first input circuit to provide a steady-state feedback from a first sense location in an output path, said first sense location being on a motherboard;
a second input circuit to provide a transient response feedback from a second sense location in the output path, said second sense location being on an electrical component that is electrically coupled to the motherboard; and
a voltage regulator to regulate a voltage on the output path to power the electrical component based at least in part on a combination of the steady-state feedback and the transient response feedback, said steady-state feedback and said transient response feedback to at least partially represent fluctuations in a power consumption rate of the electrical component during operation.
1. An apparatus comprising:
a voltage regulator having an output path to supply a voltage to power an electrical component, a power consumption rate of the electrical component to fluctuate during operation;
a board-sense circuit to sense a first feedback signal at a first sense location on the output path, said board-sense circuit comprising a transient filter to capture steady-state feedback; and
a load-sense circuit to sense a second feedback signal at a second sense location on the output path, said load-sense circuit comprising a steady state filter to capture transient feedback, said steady-state feedback and said transient feedback to at least partially represent fluctuations in the power consumption rate, and said voltage regulator to adjust the voltage based at least in part on a combination of the steady-state feedback and the transient feedback.
26. A system comprising:
a motherboard;
a processor coupled to the motherboard; and
a voltage regulation circuit to provide a voltage signal to power the processor, said voltage regulation circuit comprising
a first input circuit to provide a steady-state feedback from a first sense location in a voltage path for the voltage signal, said first sense location being on the motherboard;
a second input circuit to provide a transient response feedback from a second sense location in the voltage path, said second sense location being on the processor; and
a voltage regulator to regulate the voltage signal based at least in part on a combination of the steady-state feedback and the transient response feedback, said steady-state feedback and said transient response feedback to at least partially represent fluctuations in a power consumption rate of the processor during operation.
2. The apparatus of
a motherboard to which the voltage regulator is coupled; and
a socket to couple the electrical component to the motherboard.
3. The apparatus of
the electrical component;
wherein the first sense location is on the mother board; and
wherein the second sense location is on the electrical component.
6. The apparatus of
a capacitive element; and
a resistive element in parallel with the capacitive element.
7. The apparatus of
an active filter to amplify the transient feedback in the second feedback signal.
8. The apparatus of
an amplifier; and
a passive filter.
9. The apparatus of
the second sense location comprises a differential pair; and
the amplifier comprises:
a first resistive element coupled between a first line of the differential pair and a first node;
a second resistive element coupled between a ground node and the first node;
a third resistive element coupled between a second line of the differential pair and a second node;
a differential amplifier having a first input coupled to the first node, a second input coupled to the second node, and an output coupled to a third node; and
a fourth resistive element coupled between the second node and the third node, said third node coupled to the passive filter.
10. The apparatus of
the second sense location comprises a differential pair; and
the second sense location comprises differential sense points across the electrical component.
11. The apparatus of
a first sense pin for a source voltage at the electrical component; and
a second sense pin for a source ground at the electrical component.
12. The apparatus of
14. The apparatus of
15. The apparatus of
16. The apparatus of
17. The apparatus of
a differential amplifier having two inputs to couple with the differential pair of sense points.
18. The apparatus of
a first input resistor to couple in series with a first one of the differential pair of sense points and a first input of the two inputs of the differential amplifier;
a second input resistor to couple in series with a second one of the differential pair of sense points and a second input of the two inputs of the differential amplifier;
a ground resistor to couple a ground to the first input of the differential amplifier; and
a feedback resistor to couple an output of the differential amplifier to the second input of the differential amplifier.
19. The apparatus of
a passive, high-frequency filter coupled to the output of the differential amplifier.
20. The apparatus of
a capacitor and a resistor coupled in parallel, said capacitor and said resistor coupled in series to the output of the differential amplifier.
21. The apparatus of
an error amplifier;
a pulse-width modulator; and
a buck regulator.
23. The method of
24. The method of
passively filtering the second feedback signal to capture the transient feedback.
25. The method of
actively filtering the second feedback signal to amplify the transient feedback.
28. The system of
30. The system of
a differential amplifier having two inputs to couple with the differential pair of sense points.
|
The present invention relates to the field of voltage regulation. More specifically, the present invention relates to a multi-sense voltage regulator.
An integrated circuit (IC) may include millions of circuit elements that can be on or off at any instant in time. The voltage level in the IC tends to rise or fall according to the load (the number of active elements on or off) at any given time. Moreover, when a large number of elements transition between on or off at the same instant, the voltage level can change dramatically at that instant in time. This dramatic voltage change is often called a transient change because the voltage level droops downward or spikes upward momentarily and then eventually settles to a steady-state value.
In order for a circuit element to transition between on and off, the element is likely to require a certain minimum voltage level. In other words, if the voltage level drops too low, the circuit element may not reliably transition, which can cause unacceptable errors. One approach to this problem, at least for steady-state voltage changes, is a guard voltage.
A guard voltage guards against the voltage level dropping too low. That is, the source voltage is set high enough so that the voltage level remains higher than the minimum voltage needed even during times of heavy load. The trade-offs, however, for a guard voltage are power consumption and heat generation. Millions of circuit elements in an IC can consume a great deal of power and generate a great deal of heat. The power consumed, and the heat generated, are often directly related to the voltage level at which the elements operate. A guard voltage that is high enough to guard against heavy loads is likely to be much too high to be practical in terms of power consumption and heat generation in many modern ICs.
Furthermore, transient voltage changes may simply be too big to guard against. One approach for dealing with transient changes is to require a settling time following a transition. That is, transitions can be scheduled far enough apart in time so that the voltage level has time to settle to a steady state between transitions. Of course, the trade-off for a transient settling time is speed, potentially limiting the clock rate or operating frequency of an IC.
Another approach to dealing with changes in voltage levels is a voltage regulator. A voltage regulator can adjust a source voltage to try to compensate for changes detected in the voltage level at a load. There is virtually always some delay and inaccuracy involved, so a voltage regulator is often used in combination with a guard voltage and a settling time. Depending on the accuracy and responsiveness of a particular voltage regulator, the guard voltage and settling time may be larger or smaller. In other words, a better voltage regulator can support smaller guard voltages and smaller settling times, and, consequently, a better voltage regulator can provide faster, cooler, and more power-efficient ICs.
Examples of the present invention are illustrated in the accompanying drawings. The accompanying drawings, however, do not limit the scope of the present invention. Similar references in the drawings indicate similar elements.
In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. However, those skilled in the art will understand that the present invention may be practiced without these specific details, that the present invention is not limited to the depicted embodiments, and that the present invention may be practiced in a variety of alternative embodiments. In other instances, well known methods, procedures, components, and circuits have not been described in detail. Parts of the description will be presented using terminology commonly employed by those skilled in the art to convey the substance of their work to others skilled in the art. Repeated usage of the phrase “in one embodiment” does not necessarily refer to the same embodiment, although it may.
Embodiments of the present invention provide a voltage regulator that uses multiple sense locations in an output path between a voltage source and a load. Using multiple sense locations, embodiments of the present invention can provide improved accuracy and/or responsiveness compared to many single-sense voltage regulators. Certain embodiments of the present invention use two sense locations, one for sensing transient voltage changes at or near a load, and another sense location or point for sensing steady-state changes in the same output path, but at a platform or board level. As described below, by sensing transient changes at a load, embodiments of the present invention can support a variety of loads using a single platform, while still providing improved voltage regulator performance.
Voltage regulator 130 is also electrically connected to motherboard 140. Voltage regulator 130 regulates a source voltage and provides the source voltage to processor package 110 through an output path 160 in motherboard 140 and socket 120. Voltage regulator 130 also receives feedback voltages from sense locations 170 and 180 along output path 160, and uses the feedback voltages to regulate the source voltage.
In one embodiment, platform 150 can support a variety of loads. For instance, by employing a uniform pin configuration, a variety of processor packages can be installed in socket 120. This technique is often used in the electronics industry because a product line may, for example, include a number of processors, each providing different levels of performance at different price points. Developing and manufacturing one platform to support all, or several, of the processors can provide significant cost savings compared to developing a separate platform for each processor.
In order to regulate the voltage level at a processor package, the ideal location to sense the voltage level is usually at the processor package. This is because the farther away a sense location is from the load, the less accurate and responsive the voltage regulator is.
To use an analogy, the voltage regulator is like a dam. The load is like a mill down stream from the dam. The water level is like the voltage level. And, the water current is like electrical current. The dam can be opened and closed to regulate the water level down stream at the mill. The mill can use more or less water current at any instant in time, increasing or decreasing the water level at the mill. As the water level at the mill changes, the change is eventually propagated upstream to the dam. So, any number of locations can be monitored to get an indication of the water level at the mill. But, the best place to monitor the water level, and get the fastest response to a change, is where the change originates, i.e. at the mill where the water is used.
Many processor packages include sense pins, such as pins 115 in
Of course, taking the feedback voltage at the platform level can be relatively far removed from the actual voltage level sought to be regulated, i.e. the voltage level at the processor. This feedback may provide an accurate indication of the voltage level at the processor, but only after a change in the voltage level has had time to propagate out to the sense location.
In which case, embodiments of the present invention include at least one additional sense location, such as sense location 180 in
Using the combined feedback voltages from multiple sense locations, embodiments of the present invention can respond quickly based on the transient feedback and accurately based on the steady-state feedback. Moreover, the particular electrical characteristics of a given processor are largely irrelevant to the transient response so that embodiments of the present invention can support a variety of loads using a single platform, and a comparatively simple voltage regulator, while providing improved responsiveness and/or accuracy compared to a single-sense location voltage regulator.
Embodiments of the present invention can be used in a number of applications. For example, system 100 can represent a wide variety of electrical systems such as computers, cell phones, personal data assistances, and the like. In alternate embodiments, the load could be any of a number of electrical components, devices, or chips that can benefit from voltage regulation. Similarly, platform 150 could include any of a number of additional components, such as memory chips, data and address buses, input/output ports, etc.
Certain embodiments may use a single sense pin at the processor. In which case, the voltage level would likely be measured with respect to a source ground for the entire system. However, the system is likely to include some parasitic resistance between the ground pin of the processor and the source ground for the system. This parasitic resistance is represented by resistor 360. In order to get a more accurate measure of the voltage change across the processor, the illustrated embodiment uses two sense pins 115. One sense pin provides the source voltage level going into the processor and the other sense pin provides the voltage level at the processor's ground. In which case, feedback 320 comprises a differential pair, and the voltage level can be measured as the difference between the two lines.
Input circuit 420 can receive the feedback voltage from the sense location on the load. This load-sense circuit 420 can filter the feedback to capture and, in certain embodiments, amplify transients. Any number of passive or active filters can be used. Two potential embodiments are illustrated
Returning to
In
An operational amplifier, such as error amplifier 710, may substantially attenuate fluctuations in an input signal. In order to achieve a quick response from the amplifier, a comparatively large change in the input signal may be needed. Transient voltage changes are particularly well suited for this because they tend to be large compared to steady-state changes. In other words, by combining the large, short-lived transient feedback with the longer-lasting, smaller steady-state feedback, it may be possible to achieve a faster response from the amplifier. Furthermore, if the passive transient response is not large enough to achieve the desired response time, an amplifier, such as the one illustrated in
Error signal 715 is supplied to comparator 720, which compares the error signal to a ramp function 790. One embodiment of ramp function 790 is illustrated in
Comparator 720 is basically a pulse-width modulator. As the difference between the combined input signals and the DC reference 780 increases, error signal 715 increases, moving higher up on the ramp slope of ramp function 790. As error signal 715 moves higher up the ramp slope, the pulses of control output 795 increase in length. In other words, the larger the error, the wider the pulses.
Switches 920 and 930 can be controlled by control output 795. For example, when control output 795 is high, switch 920 can close and switch 930 can open. In which case, current from voltage source 910 flows, building-up voltage across inductor 940, capacitor 950, and load 960. Then, when control output 795 is low, switch 920 can open and switch 930 can close. Current from source 910 stops, but current continues to flow to load 960 as inductor 940 discharges. As the switches rapidly open and close, the voltage level across load 960 remains relatively uniform. As the pulse widths increase and decrease however, the average voltage across load 960 increases or decreases.
In general, embodiments of the present invention use multiple sense locations on an output path to regulate voltage.
Thus, a multi-sense voltage regulator is described. Whereas many alterations and modifications of the present invention will be comprehended by a person skilled in the art after having read the foregoing description, it is to be understood that the particular embodiments shown and described by way of illustration are in no way intended to be considered limiting. Therefore, references to details of particular embodiments are not intended to limit the scope of the claims.
Carlson, Jeffrey A., Osburn, Edward P.
Patent | Priority | Assignee | Title |
10110116, | Jun 13 2017 | International Business Machines Corporation | Implementing voltage sense point switching for regulators |
10340785, | Jun 13 2017 | International Business Machines Corporation | Implementing voltage sense point switching for regulators |
11171562, | Jul 07 2020 | NXP USA, INC. | Multi-sense point voltage regulator systems and power-regulated devices containing the same |
7868601, | Jun 15 2007 | National Semiconductor Corporation | System and method for controlling a regulator circuit for radio frequency power amplifier biases |
7906947, | Mar 08 2004 | TAHOE RESEARCH, LTD | Microprocessor die with integrated voltage regulation control circuit |
7940033, | Apr 22 2003 | Aivaka | Control loop for switching power converters |
8080897, | May 19 2009 | SIGRITY, INC | Optimal sense location |
8148959, | Mar 08 2004 | TAHOE RESEARCH, LTD | Microprocessor die with integrated voltage regulation control circuit |
8264266, | Apr 26 2006 | Aivaka, Inc. | Clock with regulated duty cycle and frequency |
8427127, | Apr 09 2004 | Aivaka, Inc | Control loop for switching power converters |
8797010, | Apr 27 2006 | Aivaka, Inc. | Startup for DC/DC converters |
Patent | Priority | Assignee | Title |
6005303, | Jun 30 1998 | INTERSIL AMERICAS LLC | Linear voltage regulator compatible with bipolar and MOSFET pass devices and associated methods |
6058030, | Nov 20 1997 | INTERSIL AMERICAS LLC | Multiple output DC-to-DC converter having enhanced noise margin and related methods |
6262566, | Jun 15 2000 | Intel Corporation | DC-to-DC controller having a multi-phase synchronous buck regulator |
6327663, | Oct 21 1998 | AMD TECHNOLOGIES HOLDINGS, INC ; GLOBALFOUNDRIES Inc | System and method for processor dual voltage detection and over stress protection |
6429728, | Sep 27 2000 | Intel Corporation | Component assisted power regulation |
6525516, | Dec 07 1999 | Volterra Semiconductor Corporation | Switching regulator with capacitance near load |
6534960, | Jun 18 2002 | Texas Instruments Incorporated | Multi-channel interleaved power converter with current sharing |
6594556, | Feb 01 1995 | Intel Corporation | Upgradeable voltage regulator modules |
6642631, | Oct 17 2000 | DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT | Circuit and method of direct duty cycle current sharing |
6664774, | Mar 27 2002 | JPMORGAN CHASE BANK, N A , AS SUCCESSOR AGENT | Offset peak current mode control circuit for multiple-phase power converter |
6696822, | Jul 30 2001 | RAKUTEN GROUP, INC | Voltage regulator with a constant current circuit and additional current sourcing/sinking |
6791390, | May 28 2002 | DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT | Method of forming a voltage regulator semiconductor device having feedback and structure therefor |
6879489, | Feb 06 2003 | Intel Corporation | Processor sensing voltage regulator |
RE38371, | Jun 15 2000 | Intel Corporation | DC-to-DC controller having a multi-phase synchronous buck regulator |
Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
Oct 20 2003 | OSBURN, EDWARD P | Intel Corporation | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 014642 | /0694 | |
Oct 20 2003 | CARLSON, JEFFREY A | Intel Corporation | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 014642 | /0694 | |
Oct 23 2003 | Intel Corporation | (assignment on the face of the patent) | / | |||
Jul 18 2022 | Intel Corporation | TAHOE RESEARCH, LTD | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 061175 | /0176 |
Date | Maintenance Fee Events |
Feb 25 2010 | M1551: Payment of Maintenance Fee, 4th Year, Large Entity. |
Feb 19 2014 | M1552: Payment of Maintenance Fee, 8th Year, Large Entity. |
Feb 22 2018 | M1553: Payment of Maintenance Fee, 12th Year, Large Entity. |
Date | Maintenance Schedule |
Sep 05 2009 | 4 years fee payment window open |
Mar 05 2010 | 6 months grace period start (w surcharge) |
Sep 05 2010 | patent expiry (for year 4) |
Sep 05 2012 | 2 years to revive unintentionally abandoned end. (for year 4) |
Sep 05 2013 | 8 years fee payment window open |
Mar 05 2014 | 6 months grace period start (w surcharge) |
Sep 05 2014 | patent expiry (for year 8) |
Sep 05 2016 | 2 years to revive unintentionally abandoned end. (for year 8) |
Sep 05 2017 | 12 years fee payment window open |
Mar 05 2018 | 6 months grace period start (w surcharge) |
Sep 05 2018 | patent expiry (for year 12) |
Sep 05 2020 | 2 years to revive unintentionally abandoned end. (for year 12) |