A color detector includes a light source, a photodiode, and a filter tuned to only allow light of a specific color to pass through to the photodiode. When the light reaches the photodiode, the photodiode outputs a current that indicates that the color is present in the light. The filter may include a pair of partially reflective layers consisting of a reflective metal, such as silver. To prevent the metal from oxidizing or reacting with the environment, the partially reflective layers may be coated with a protective layer, such as aluminum nitride. The color detector may further include a color enhancing layer. Finally, the color detector may include a capping layer. Accordingly, the color detector provided herein allows for the filter to use metals for partially reflective layers that would normally oxidize, as well as detect light of a specific spectrum of wavelengths.
|
18. A color enhancer comprising:
a substrate having a first color enhancing layer and a second color enhancing layer; and
a cover layer disposed on said second color enhancing layer, wherein said first color enhancing layer is formed from silicon nitride and said second color enhancing layer is formed from aluminum nitride.
1. A color detector comprising:
a light source;
a photodiode in optical communication with said light source;
a filter integrally formed on said photodiode, wherein said filter includes a first partially reflective layer spaced from a second partially reflective layer and a spacer layer disposed therebetween; and
a color enhancer disposed between said photodiode and said filter.
14. A color filter comprising:
a first partially reflective layer;
a second partially reflective layer spaced from said first partially reflective layer;
a spacer layer disposed between said first partially reflective layer and said second partially reflective layer; and
wherein said first reflective layer and said second partially reflective layer are formed from silver; and
a first protective layer disposed on said first partially reflective layer and a second protective layer disposed on said second partially reflective layer, wherein the first protective layer and the second protective layer are formed from aluminum nitride.
2. A color detector as set forth in
3. A color detector as set forth in
4. A color detector as set forth in
5. A color detector as set forth in
6. A color detector as set forth in
7. A color detector as set forth in
8. A color detector as set forth in
9. A color detector as set forth in
10. A color detector as set forth in
11. A color detector as set forth in
12. A color detector as set forth in
13. A color detector as set forth in
15. A color filter as set forth in
16. A color filter as set forth in
17. A color filter as set forth in
19. A color enhancer as set forth in
20. A color enhancer as set forth in
|
|||||||||||||||||||||||
Spectrophotometry is the study of electromagnetic waves in the visible, near-ultraviolet, and near-infrared spectra. A spectrophotometer is a light measuring device that is configured to measure various characteristics of light, including intensity, color, and/or wavelength. Spectrophotometers have a wide range of uses. For instance, they may be used to detect colors on display devices such as televisions, projectors, monitors, and camcorder viewfinders. Alternatively, spectrophotometers may be used in printing devices to calibrate the colors printed.
Typically, when used as a color detector, the spectrophotometer may include a light source, a light collector, such as a photodiode, and a filter. In one instance, the light is projected toward an object. The object reflects the light, and the photodiode receives the reflected light. The light may pass through the filter before being received by the photodiode so that the color may be detected. Specifically, the filter is configured to only allow light having a specific range of wavelengths to pass through. Light that passes through generates current in the photodiode. This current indicates that the specific color of light is present. An array of photodiodes and filters allow for the spectrophotometer to receive more detailed information. For example, an array of 20 photodiodes each having a filter tuned/designed to filter light at different wavelengths would be able to discriminate between more colors than a system with fewer photodiodes.
While useful in many technology areas, spectrophotometers have several problems. For instance, the filter may include two metal films. However, the metal film may begin to oxidize after being exposed to air. The oxidization of the metal film reduces the net internal reflectance from the metal coating altering the performance of the filter as it degrades. The main effect of the reflectance degradation is to widen the bandwidth of the filter for a given transmission peak of the filter. This will reduce the color discrimination of the filter array as the filters overlap one another more in wavelength. Another problem for Silicon based photodiode systems is that certain wavelengths of light are difficult to detect. This is especially true for the blue region of the color spectrum. In order to compensate for this, some spectrophotometers amplify these colors electrically with an amplifier in order to make them more easily detectible; however, the amplifier also amplifies noise received by the sensor. The increased noise may lead to inaccurate readings by the light collector.
Accordingly, a spectrophotometer or color detector is needed having an improved filter and/or allow for color amplification without amplifying noise.
A color detector includes a light source, a photodiode, and a filter disposed between the light source and the photodiode. The filter is tuned to only allow light having a specific spectrum of wavelengths to pass through to the photodiode. When the light reaches the photodiode, the photodiode outputs a current. The current indicates the presence of the color in the specific spectrum of wavelengths. Multiple color detectors may be arranged in an array to indicate the presence of multiple colors by reading the detector output directly, or alternately, the outputs of the multiple color detectors arranged in an array may be used in conjunction with a suitable color conversion algorithm to determine the input color. The filter may include a pair of partially reflective layers coated in a reflective metal, such as silver. To prevent the metal from oxidizing or reacting with the environment, the reflective layers may be coated with a protective layer, such as aluminum nitride. The color detector may further include color enhancing layers having a typical high-low index material combination, thereby maximizing the transmission of a wavelength region of interest. The choice of thickness of the high-low index material combination effect the wavelength region of the maximization. Finally, the color detector may include a capping layer that will tend to flatten or equalize the peak transmission of the filter across a given array of color detectors that have been tuned/designed to cover a given spectral band. Accordingly, the color detector provided herein allows for the filter to use metals for partially reflective layers that would normally oxidize or degrade, as well as maximize the detected light of a specific spectrum of wavelengths.
In one exemplary approach, the color detector may be used with a printer to calibrate colors printed on a page. Specifically, the color detector may detect the color of the page, and the printer may be configured to eject different amounts of ink for different colors of paper. For example, if yellow ink is desired, but the page is blue, yellow ink will not appear the yellow color intended on the page. Therefore, the color detector detects the color of the page and configures the printer to eject the ink so that the desired color is shown on the page.
Referring to
Multiple filters 16 may be used with the color detector 10, and each filter 16 may be tuned to a unique specific spectrum of wavelengths. In one exemplary approach, the specific spectrum of wavelengths of each filter 16 may at least partially overlap. Furthermore, when multiple filters 16 are used, the color detector 10 may include multiple photodiodes 14—at least one for each filter 16. In one exemplary approach, the color detector 10 may include seven filters 16 and seven photodiodes 14. Each filter 16 may be tuned to allow different colors to pass through to the corresponding photodiode 14.
By way of example, the filters 16 may be configured to detect wavelength spectrums corresponding to “red,” “orange,” “yellow,” “green,” “blue,” “indigo,” and “violet.” If the sample 18 is in the “red” spectrum, the light will only pass through the filter 16 admitting wavelengths corresponding to the “red” spectrum, and be blocked by the other filters 16. Therefore, only the photodiode 14 corresponding to the “red” filter 16 will output a current, indicating the presence of a color in the “red” spectrum. Similarly, if the sample 18 is “green,” the light will only pass through the filter 16 admitting wavelengths corresponding to the “green” spectrum, and be blocked by the other filters 16. Therefore, only the photodiode 14 corresponding to the “green” filter 16 will output a current, indicating the presence of a color in the “green” spectrum. Using more filters 16 and corresponding photodiodes 14 allows the color detector 10 to distinguish between varying hues of color. For instance, with additional filters 16 and corresponding photodiodes 14, the color detector 10 may be able to distinguish between “baby blue,” “sky blue,” and “navy blue,” as opposed to just recognizing the color as being in the “blue” spectrum.
In one exemplary approach, the filter 16 may include a first partially reflective layer 26 spaced from a second partially reflective layer 28. A spacer layer 30 formed from, for example silicon dioxide, may be disposed between the first partially reflective layer 26 and the second partially reflective layer 28. The spacer layer 30 may alternatively be formed from other materials. This type of filter 16 may be known in the art as a Fabry-Perot etalon or Fabry-Perot interferometer, although other types of filters 16 may be used. Light may pass through one of the partially reflective layers and is reflected between the two partially reflective layers. As illustrated, light may pass through the first partially reflective layer 26 and reflect between the first partially reflective layer 26 and the second partially reflective layer 28. This is known as internal reflection. If the internal reflections are in phase (i.e., constructive), the light will pass through the filter 16. If the internal reflections are out of phase (i.e., destructive), the light waves will tend to cancel each other out, and result in little or no light passing through the filter 16. Whether the internal reflections are constructive or destructive depends on the wavelength of the light (i.e., the color), the angle of the light entering the filter 16, the thickness of the spacer layer 30, and the refractive index of the spacer layer 30. As previously discussed, the color of the light is dependent upon the color of the sample 18. However, the angle of the light entering the filter 16, the thickness of the spacer layer 30, and the refractive index of the material making up the spacer layer 30 may be adjusted to allow light in a specific spectrum of wavelengths to pass through.
The color detector 10 may further include a color enhancer 36 disposed between the photodiode 14 and the filter 16. The color enhancer 36 may be used to reduce the absorption and reflectance profiles of the coating thereby maximizing the transmission of the filter for colors in specific color spectrums. For instance, colors in the “blue” spectrum may be partially absorbed by certain materials, making it difficult for the color detector 10 to detect colors in that spectrum. The “blue” spectrum is merely exemplary and the color enhancer 36 may be used to enhance transmission of colors in other spectrums. In one exemplary approach, the color enhancer 36 may include a high-low index material combination 38 that is designed to maximize the transmission of the filter disposed on the photodiode 14. In one exemplary approach, the color enhancing layer 38 may be formed from a combination of silicon dioxide and silicon nitride, although the color enhancing layer 38 may be formed from other materials. The color enhancing layer 38 may include a first color enhancing layer 40 and a second color enhancing layer 42 disposed on a low index material 44 such as silicon dioxide directly on top photodiode 14. The first color enhancing layer 40 may be formed from aluminum nitride, although the first color enhancing layer 40 may be formed from other materials. In one exemplary approach, the second color enhancing layer 42 is disposed on the second partially reflective layer 28. In this example, the second color enhancing layer 42 may be formed from silicon nitride, although the second color enhancing layer 42 may be formed from other materials. When the first color enhancing layer 40 is formed from aluminum nitride, the first color enhancing layer 40 may also help prevent degradation effects from the second partially reflective layer 28, as well as act as a color enhancing layer. The color enhancer 36 may further include a cover layer 44 disposed between the photodiode 14 and the color enhancing layer 38. Specifically, the cover layer 44 may be disposed between the photodiode 14 and the second color enhancing layer 42. In one exemplary approach, the cover layer 44 may be formed from silicon dioxide.
Furthermore, the color detector 10 may include a capping layer 46 disposed on the first protective layer 32. In one exemplary approach, the capping layer 46 is formed from silicon dioxide, although the capping layer 46 may be formed from another material. The capping layer 46 may be used to help equalize or flatten the peak transmission of the various filters in the photodiode array. Specifically, the thickness of the capping layer 46 may help tune the filter 16. In one exemplary approach, the capping layer 46 is formed from a dielectric material, the thickness of which allows the filter 16 to be tuned in a specific region to have a spectral flattening effect on the filters 16.
It is to be understood that the above description is intended to be illustrative and not restrictive. Many embodiments and applications other than the examples provided would be apparent to those skilled in the art upon reading the above description. The scope of the invention should be determined, not with reference to the above description, but should instead be determined with reference to the appended claims, along with the full scope of equivalents to which such claims are entitled. It is anticipated and intended that future developments will occur in the arts discussed herein, and that the disclosed systems and methods will be incorporated into such future embodiments. In sum, it should be understood that the invention is capable of modification and variation and is limited only by the following claims.
All terms used in the claims are intended to be given their broadest reasonable constructions and their ordinary meanings as understood by those skilled in the art unless an explicit indication to the contrary is made herein. In particular, use of the singular articles such as “a,” “the,” “said,” etc. should be read to recite one or more of the indicated elements unless a claim recites an explicit limitation to the contrary.
Kearl, Daniel A., Monroe, Michael G., Clark, Stephan R., Valencia, Melinda M.
| Patent | Priority | Assignee | Title |
| Patent | Priority | Assignee | Title |
| 5144498, | Feb 14 1990 | Hewlett-Packard Company | Variable wavelength light filter and sensor system |
| 5272518, | Dec 17 1990 | Hewlett-Packard Company | Colorimeter and calibration system |
| 5359615, | Nov 21 1991 | Research Development Corporation of Japan | Method for forming microilluminants |
| 5428635, | Jan 11 1994 | American Biogenetic Sciences, Inc | Multi-wavelength tunable laser |
| 5621523, | Aug 27 1992 | Kowa Company Ltd. | Method and apparatus for measuring particles in a fluid |
| 5786893, | Apr 15 1993 | Board of Regents, The University of Texas System | Raman spectrometer |
| 5850623, | Oct 09 1997 | ROSEMOUNT ANALYTICAL INC | Method for standardizing raman spectrometers to obtain stable and transferable calibrations |
| 5999259, | Oct 02 1998 | Innovative Lasers Corporation | Contaminant identification and concentration determination by monitoring the wavelength, or intensity at a specific wavelength, of the output of an intracavity laser |
| 6011623, | Jun 09 1998 | JDS Fitel Inc | Fault detection system for an amplified optical transmission system |
| 6141136, | Aug 27 1999 | Active phase-shift control in optical-hybrid etalons | |
| 6256328, | May 15 1998 | Research Foundation of the University of Central Florida, Inc | Multiwavelength modelocked semiconductor diode laser |
| 6349156, | Oct 28 1999 | AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE LIMITED | Semiconductor etalon device, optical control system and method |
| 6380531, | Dec 04 1998 | BOARD OF TRUSTEES OF THE LELAND STANFORD JUNIOR UNVERSITY, THE | Wavelength tunable narrow linewidth resonant cavity light detectors |
| 6661816, | Jun 11 1998 | Research Foundation of the University of Central Florida, Inc | Multiwavelength modelocked lasers |
| 6912052, | Nov 17 2000 | Cymer, LLC | Gas discharge MOPA laser spectral analysis module |
| 7009716, | Aug 26 2003 | Electronics and Telecommunications Research Institute | System for monitoring optical output/wavelength |
| 7292343, | Nov 17 2000 | Cymer, Inc. | Gas discharge MOPA laser spectral analysis module |
| 7521666, | Jul 06 2005 | CAPELLA MICROSYSTEMS, CORP | Multi-cavity Fabry-Perot ambient light filter apparatus |
| 7811725, | Mar 16 2006 | Wintek Corporation | Color filter substrate |
| 20010036209, | |||
| 20030235924, | |||
| 20040223882, | |||
| 20050046856, | |||
| 20050046868, | |||
| 20050101026, | |||
| 20050142035, | |||
| 20050174576, | |||
| 20060144335, | |||
| 20060198404, | |||
| 20070217045, | |||
| DE102005062482, | |||
| EP415401, | |||
| EP442738, | |||
| EP491131, | |||
| EP552539, | |||
| EP560006, | |||
| EP586146, | |||
| EP745658, | |||
| EP876609, | |||
| EP964536, | |||
| EP992093, | |||
| GB2387961, | |||
| GB2399875, | |||
| GB2421738, | |||
| JP1066458, | |||
| JP1982184937, | |||
| JP1989300202, | |||
| JP2007219483, | |||
| JP3204111, | |||
| JP3264339, | |||
| JP3309319, | |||
| JP4119721, | |||
| JP4179278, | |||
| JP4200685, | |||
| JP5274507, | |||
| JP57042824, | |||
| JP6242817, | |||
| WO20844, | |||
| WO2004063681, | |||
| WO2005068981, | |||
| WO2006020702, | |||
| WO2007027196, | |||
| WO9424545, | |||
| WO9841825, | |||
| WO9936788, |
| Executed on | Assignor | Assignee | Conveyance | Frame | Reel | Doc |
| Jan 25 2008 | CLARK, STEPHAN R | HEWLETT-PACKARD DEVELOPMENT COMPANY, L P | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 024847 | /0725 | |
| Jan 25 2008 | VALENCIA, MELINDA M | HEWLETT-PACKARD DEVELOPMENT COMPANY, L P | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 024847 | /0725 | |
| Jan 25 2008 | KEARL, DANIEL A | HEWLETT-PACKARD DEVELOPMENT COMPANY, L P | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 024847 | /0725 | |
| Jan 28 2008 | MONROE, MICHAEL G | HEWLETT-PACKARD DEVELOPMENT COMPANY, L P | ASSIGNMENT OF ASSIGNORS INTEREST SEE DOCUMENT FOR DETAILS | 024847 | /0725 | |
| Feb 12 2008 | Hewlett-Packard Development Company, L.P. | (assignment on the face of the patent) | / |
| Date | Maintenance Fee Events |
| May 30 2016 | M1551: Payment of Maintenance Fee, 4th Year, Large Entity. |
| Aug 03 2020 | REM: Maintenance Fee Reminder Mailed. |
| Jan 18 2021 | EXP: Patent Expired for Failure to Pay Maintenance Fees. |
| Date | Maintenance Schedule |
| Dec 11 2015 | 4 years fee payment window open |
| Jun 11 2016 | 6 months grace period start (w surcharge) |
| Dec 11 2016 | patent expiry (for year 4) |
| Dec 11 2018 | 2 years to revive unintentionally abandoned end. (for year 4) |
| Dec 11 2019 | 8 years fee payment window open |
| Jun 11 2020 | 6 months grace period start (w surcharge) |
| Dec 11 2020 | patent expiry (for year 8) |
| Dec 11 2022 | 2 years to revive unintentionally abandoned end. (for year 8) |
| Dec 11 2023 | 12 years fee payment window open |
| Jun 11 2024 | 6 months grace period start (w surcharge) |
| Dec 11 2024 | patent expiry (for year 12) |
| Dec 11 2026 | 2 years to revive unintentionally abandoned end. (for year 12) |