Patent
   D262950
Priority
Mar 26 1979
Filed
Mar 26 1979
Issued
Feb 09 1982
Expiry
Feb 09 1996
Assg.orig
Entity
unknown
3
6
n/a
The ornamental design for a coordinate measurement machine for use in measuring sizes, shapes, dimensions and the like, substantially as shown and described.

FIG. 1 is a left front perspective view of a coordinate measuring machine showing the design of the present invention.

FIG. 2 is a right side elevational view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a front elevational view thereof, the rear being unornamented.

Orr, II, Russell E.

Patent Priority Assignee Title
D302392, Jul 21 1986 Giddings & Lewis, LLC Coordinate measuring machine
D314347, May 25 1988 Mauser-Werke Oberndorf GmbH Measuring center
D323628, Apr 25 1989 Tokyo Electron Limited Semiconductor wafer measuring instrument
Patent Priority Assignee Title
3239941,
3403448,
3624910,
3757423,
3774311,
4175327, Apr 26 1977 CARL-ZEISS-STIFTUNG, HEIDENHEIM BRENZ, DBA CARL ZEISS Measuring machine
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Mar 26 1979The Bendix Corporation(assignment on the face of the patent)
Dec 21 1984BENDIX CORPORATION, THEWARNER & SWASEY COMPANY, THEASSIGNMENT OF ASSIGNORS INTEREST 0043550142 pdf
Oct 31 1991WARNER & SWASEY COMPANY, THE, A CORP OF MICITICORP USA, INC SECURITY INTEREST SEE DOCUMENT FOR DETAILS 0059000719 pdf
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