Patent
   D262950
Priority
Mar 26 1979
Filed
Mar 26 1979
Issued
Feb 09 1982
Expiry
Feb 09 1996
Assg.orig
Entity
unknown
3
6
n/a
The ornamental design for a coordinate measurement machine for use in measuring sizes, shapes, dimensions and the like, substantially as shown and described.

FIG. 1 is a left front perspective view of a coordinate measuring machine showing the design of the present invention.

FIG. 2 is a right side elevational view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a front elevational view thereof, the rear being unornamented.

Orr, II, Russell E.

Patent Priority Assignee Title
D302392, Jul 21 1986 Giddings & Lewis, LLC Coordinate measuring machine
D314347, May 25 1988 Mauser-Werke Oberndorf GmbH Measuring center
D323628, Apr 25 1989 Tokyo Electron Limited Semiconductor wafer measuring instrument
Patent Priority Assignee Title
3239941,
3403448,
3624910,
3757423,
3774311,
4175327, Apr 26 1977 Carl Zeiss-Stiftung Measuring machine
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Executed onAssignorAssigneeConveyanceFrameReelDoc
Mar 26 1979The Bendix Corporation(assignment on the face of the patent)
Dec 21 1984BENDIX CORPORATION, THEWARNER & SWASEY COMPANY, THEASSIGNMENT OF ASSIGNORS INTEREST 0043550142 pdf
Oct 31 1991WARNER & SWASEY COMPANY, THE, A CORP OF MICITICORP USA, INC SECURITY INTEREST SEE DOCUMENT FOR DETAILS 0059000719 pdf
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