Semiconductor wafer measuring instrument

Abstract

Description

FIG. 1 is a top, front and right side perspective view of a semiconductor wafer measuring instrument showing my new design;

FIG. 2 is a front elevational view;

FIG. 3 is a right side elevational view, the left side elevational view being a mirror image;

FIG. 4 is a top plan view;

FIG. 5 is a rear elevational view; and

FIG. 6 is a bottom plan view thereof.

Claims

The ornamental design for a semiconductor wafer measuring instrument, as shown and described.